中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Gettering of Cu to voids induced by H+ implantation in SIMOX substrate

文献类型:期刊论文

作者Zhang,M ; Lin,CL ; Hemment,PLF ; Gutjahr,K ; Gosele,U
刊名PROCEEDINGS OF THE EIGHTH INTERNATIONAL SYMPOSIUM ON SILICON-ON-INSULATOR TECHNOLOGY AND DEVICES
出版日期1997
卷号97期号:23页码:86-91
通讯作者Zhang, M, CHINESE ACAD SCI,SHANGHAI INST MET,STATE KEY LAB FUNCT MAT INFORMAT,SHANGHAI 200050,PEOPLES R CHINA
学科主题Electrochemistry
收录类别SCI
原文出处http://apps.webofknowledge.com/full_record.do?product=WOS&search_mode=GeneralSearch&qid=162&SID=T1bBjPaMHA4PI3h27lN&page=1&doc=1
公开日期2012-03-25
源URL[http://ir.sim.ac.cn/handle/331004/98892]  
专题上海微系统与信息技术研究所_功能材料与器件_期刊论文(1999年以前)
推荐引用方式
GB/T 7714
Zhang,M,Lin,CL,Hemment,PLF,et al. Gettering of Cu to voids induced by H+ implantation in SIMOX substrate[J]. PROCEEDINGS OF THE EIGHTH INTERNATIONAL SYMPOSIUM ON SILICON-ON-INSULATOR TECHNOLOGY AND DEVICES,1997,97(23):86-91.
APA Zhang,M,Lin,CL,Hemment,PLF,Gutjahr,K,&Gosele,U.(1997).Gettering of Cu to voids induced by H+ implantation in SIMOX substrate.PROCEEDINGS OF THE EIGHTH INTERNATIONAL SYMPOSIUM ON SILICON-ON-INSULATOR TECHNOLOGY AND DEVICES,97(23),86-91.
MLA Zhang,M,et al."Gettering of Cu to voids induced by H+ implantation in SIMOX substrate".PROCEEDINGS OF THE EIGHTH INTERNATIONAL SYMPOSIUM ON SILICON-ON-INSULATOR TECHNOLOGY AND DEVICES 97.23(1997):86-91.

入库方式: OAI收割

来源:上海微系统与信息技术研究所

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