Control of the YSZ biaxial alignment on polycrystalline Ni-Cr substrates by ion beam selective resputtering
文献类型:期刊论文
作者 | Mao,YJ ; Jiang,BY ; Ren,CX ; Zhang,F ; Liu,XH ; Zou,SC |
刊名 | THIN SOLID FILMS
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出版日期 | 1998 |
卷号 | 312期号:1-2页码:27-31 |
关键词 | THIN-FILM ORIENTATION BUFFER LAYERS ASSISTED DEPOSITION LASER DEPOSITION ZIRCONIA FILMS BOMBARDMENT GROWTH |
ISSN号 | 0040-6090 |
通讯作者 | Mao, YJ, Chinese Acad Sci, Shanghai Inst Met, Ion Beam Lab, Shanghai 200050, Peoples R China |
学科主题 | Materials Science ; Multidisciplinary; Materials Science ; Coatings & Films; Physics ; Applied; Physics ; Condensed Matter |
收录类别 | SCI |
公开日期 | 2012-03-25 |
源URL | [http://ir.sim.ac.cn/handle/331004/99028] ![]() |
专题 | 上海微系统与信息技术研究所_功能材料与器件_期刊论文(1999年以前) |
推荐引用方式 GB/T 7714 | Mao,YJ,Jiang,BY,Ren,CX,et al. Control of the YSZ biaxial alignment on polycrystalline Ni-Cr substrates by ion beam selective resputtering[J]. THIN SOLID FILMS,1998,312(1-2):27-31. |
APA | Mao,YJ,Jiang,BY,Ren,CX,Zhang,F,Liu,XH,&Zou,SC.(1998).Control of the YSZ biaxial alignment on polycrystalline Ni-Cr substrates by ion beam selective resputtering.THIN SOLID FILMS,312(1-2),27-31. |
MLA | Mao,YJ,et al."Control of the YSZ biaxial alignment on polycrystalline Ni-Cr substrates by ion beam selective resputtering".THIN SOLID FILMS 312.1-2(1998):27-31. |
入库方式: OAI收割
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