中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Control of the YSZ biaxial alignment on polycrystalline Ni-Cr substrates by ion beam selective resputtering

文献类型:期刊论文

作者Mao,YJ ; Jiang,BY ; Ren,CX ; Zhang,F ; Liu,XH ; Zou,SC
刊名THIN SOLID FILMS
出版日期1998
卷号312期号:1-2页码:27-31
关键词THIN-FILM ORIENTATION BUFFER LAYERS ASSISTED DEPOSITION LASER DEPOSITION ZIRCONIA FILMS BOMBARDMENT GROWTH
ISSN号0040-6090
通讯作者Mao, YJ, Chinese Acad Sci, Shanghai Inst Met, Ion Beam Lab, Shanghai 200050, Peoples R China
学科主题Materials Science ; Multidisciplinary; Materials Science ; Coatings & Films; Physics ; Applied; Physics ; Condensed Matter
收录类别SCI
公开日期2012-03-25
源URL[http://ir.sim.ac.cn/handle/331004/99028]  
专题上海微系统与信息技术研究所_功能材料与器件_期刊论文(1999年以前)
推荐引用方式
GB/T 7714
Mao,YJ,Jiang,BY,Ren,CX,et al. Control of the YSZ biaxial alignment on polycrystalline Ni-Cr substrates by ion beam selective resputtering[J]. THIN SOLID FILMS,1998,312(1-2):27-31.
APA Mao,YJ,Jiang,BY,Ren,CX,Zhang,F,Liu,XH,&Zou,SC.(1998).Control of the YSZ biaxial alignment on polycrystalline Ni-Cr substrates by ion beam selective resputtering.THIN SOLID FILMS,312(1-2),27-31.
MLA Mao,YJ,et al."Control of the YSZ biaxial alignment on polycrystalline Ni-Cr substrates by ion beam selective resputtering".THIN SOLID FILMS 312.1-2(1998):27-31.

入库方式: OAI收割

来源:上海微系统与信息技术研究所

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