中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Influence of the addition of Co and Ni on the formation of epitaxial semiconducting beta-FeSi2: Comparison of different evaporation methods

文献类型:期刊论文

作者Mangelinck, D ; Wang, L ; Lin, C ; Gas, P ; Grahn, J ; Ostling, M
刊名JOURNAL OF APPLIED PHYSICS
出版日期1998
卷号83期号:8页码:4193-4201
关键词ION-BEAM SYNTHESIS SOLID-PHASE EPITAXY THIN-FILM FORMATION OPTICAL-PROPERTIES IRON SILICIDES ELECTRONIC-STRUCTURE SILICON COBALT GROWTH IMPLANTATION
ISSN号0021-8979
通讯作者Mangelinck, D, Kungl Tekn Hogskolan, Dept Elect, POB Electrum 229, S-16440 Kista, Sweden
学科主题Physics, Applied
收录类别SCI
语种英语
公开日期2012-03-25
源URL[http://ir.sim.ac.cn/handle/331004/99036]  
专题上海微系统与信息技术研究所_功能材料与器件_期刊论文(1999年以前)
推荐引用方式
GB/T 7714
Mangelinck, D,Wang, L,Lin, C,et al. Influence of the addition of Co and Ni on the formation of epitaxial semiconducting beta-FeSi2: Comparison of different evaporation methods[J]. JOURNAL OF APPLIED PHYSICS,1998,83(8):4193-4201.
APA Mangelinck, D,Wang, L,Lin, C,Gas, P,Grahn, J,&Ostling, M.(1998).Influence of the addition of Co and Ni on the formation of epitaxial semiconducting beta-FeSi2: Comparison of different evaporation methods.JOURNAL OF APPLIED PHYSICS,83(8),4193-4201.
MLA Mangelinck, D,et al."Influence of the addition of Co and Ni on the formation of epitaxial semiconducting beta-FeSi2: Comparison of different evaporation methods".JOURNAL OF APPLIED PHYSICS 83.8(1998):4193-4201.

入库方式: OAI收割

来源:上海微系统与信息技术研究所

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