中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Total dose radiation effects of Au/PbZr0.52Ti0.48O3/YBa2Cu3O7-delta capacitors

文献类型:期刊论文

作者Gao, JX ; Zheng, LR ; Duo, XZ ; Huang, JP ; Yang, LX ; Lin, CL ; Yan, RL
刊名THIN SOLID FILMS
出版日期1999
卷号340期号:1-2页码:132-136
关键词FERROELECTRIC THIN-FILMS IONIZING-RADIATION O HETEROSTRUCTURES PZT CAPACITORS FATIGUE RETENTION MEMORIES SILICON
ISSN号0040-6090
通讯作者Gao, JX, Chinese Acad Sci, Shanghai Inst Met, State Key Lab Funct Mat Informat, Shanghai 200050, Peoples R China
学科主题Materials Science, Multidisciplinary; Materials Science, Coatings & Films; Physics, Applied; Physics, Condensed Matter
收录类别SCI
语种英语
公开日期2012-03-25
源URL[http://ir.sim.ac.cn/handle/331004/99160]  
专题上海微系统与信息技术研究所_功能材料与器件_期刊论文(1999年以前)
推荐引用方式
GB/T 7714
Gao, JX,Zheng, LR,Duo, XZ,et al. Total dose radiation effects of Au/PbZr0.52Ti0.48O3/YBa2Cu3O7-delta capacitors[J]. THIN SOLID FILMS,1999,340(1-2):132-136.
APA Gao, JX.,Zheng, LR.,Duo, XZ.,Huang, JP.,Yang, LX.,...&Yan, RL.(1999).Total dose radiation effects of Au/PbZr0.52Ti0.48O3/YBa2Cu3O7-delta capacitors.THIN SOLID FILMS,340(1-2),132-136.
MLA Gao, JX,et al."Total dose radiation effects of Au/PbZr0.52Ti0.48O3/YBa2Cu3O7-delta capacitors".THIN SOLID FILMS 340.1-2(1999):132-136.

入库方式: OAI收割

来源:上海微系统与信息技术研究所

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