中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Novel STI scheme and layout design to suppress the kink effect in LDMOS transistors

文献类型:期刊论文

作者Wang, L ; Wang, J ; Li, R ; Lee, P ; Hu, J ; Qu, W ; Li, WJ ; Yang, S
刊名SEMICONDUCTOR SCIENCE AND TECHNOLOGY
出版日期2008
卷号23期号:7页码:75025-75025
关键词SHALLOW TRENCH ISOLATION NARROW MOSFETS OXIDE
ISSN号0268-1242
通讯作者Wang, L, Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, Shanghai, Peoples R China
学科主题Engineering, Electrical & Electronic; Materials Science, Multidisciplinary; Physics, Condensed Matter
收录类别SCI
语种英语
公开日期2012-03-24
源URL[http://ir.sim.ac.cn/handle/331004/94924]  
专题上海微系统与信息技术研究所_功能材料与器件_期刊论文
推荐引用方式
GB/T 7714
Wang, L,Wang, J,Li, R,et al. Novel STI scheme and layout design to suppress the kink effect in LDMOS transistors[J]. SEMICONDUCTOR SCIENCE AND TECHNOLOGY,2008,23(7):75025-75025.
APA Wang, L.,Wang, J.,Li, R.,Lee, P.,Hu, J.,...&Yang, S.(2008).Novel STI scheme and layout design to suppress the kink effect in LDMOS transistors.SEMICONDUCTOR SCIENCE AND TECHNOLOGY,23(7),75025-75025.
MLA Wang, L,et al."Novel STI scheme and layout design to suppress the kink effect in LDMOS transistors".SEMICONDUCTOR SCIENCE AND TECHNOLOGY 23.7(2008):75025-75025.

入库方式: OAI收割

来源:上海微系统与信息技术研究所

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