中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
A model with temperature-dependent exponent for hot-carrier injection in high-voltage nMOSFETs involving hot-hole injection and dispersion

文献类型:期刊论文

作者Dai, MZ ; Gao, C ; Yap, K ; Shan, Y ; Cao, Z ; Liao, K ; Wang, L ; Cheng, B ; Liu, S
刊名IEEE TRANSACTIONS ON ELECTRON DEVICES
出版日期2008
卷号55期号:5页码:1255-1258
关键词MOSFETS
ISSN号0018-9383
通讯作者Dai, MZ, Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, Shanghai 200050, Peoples R China
学科主题Engineering, Electrical & Electronic; Physics, Applied
收录类别SCI
语种英语
公开日期2012-03-24
源URL[http://ir.sim.ac.cn/handle/331004/94957]  
专题上海微系统与信息技术研究所_功能材料与器件_期刊论文
推荐引用方式
GB/T 7714
Dai, MZ,Gao, C,Yap, K,et al. A model with temperature-dependent exponent for hot-carrier injection in high-voltage nMOSFETs involving hot-hole injection and dispersion[J]. IEEE TRANSACTIONS ON ELECTRON DEVICES,2008,55(5):1255-1258.
APA Dai, MZ.,Gao, C.,Yap, K.,Shan, Y.,Cao, Z.,...&Liu, S.(2008).A model with temperature-dependent exponent for hot-carrier injection in high-voltage nMOSFETs involving hot-hole injection and dispersion.IEEE TRANSACTIONS ON ELECTRON DEVICES,55(5),1255-1258.
MLA Dai, MZ,et al."A model with temperature-dependent exponent for hot-carrier injection in high-voltage nMOSFETs involving hot-hole injection and dispersion".IEEE TRANSACTIONS ON ELECTRON DEVICES 55.5(2008):1255-1258.

入库方式: OAI收割

来源:上海微系统与信息技术研究所

浏览0
下载0
收藏0
其他版本

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。