中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Remarkable resistance change in plasma oxidized TiOx/TiNx film for memory application

文献类型:期刊论文

作者Wu, LC ; Song, ZT ; Liu, B ; Rao, F ; Xu, C ; Zhang, T ; Yin, WJ ; Feng, SL
刊名CHINESE PHYSICS LETTERS
出版日期2007
卷号24期号:4页码:1103-1105
关键词RANDOM-ACCESS MEMORY THIN OXIDE-FILMS GE2SB2TE5 FILMS ELECTRICAL-PROPERTIES NEGATIVE RESISTANCE NIO FILMS
ISSN号0256-307X
通讯作者Wu, LC, Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, Res Ctr Funct Semicond Film Engn & Technol, Nanotechnol Lab, Shanghai 200050, Peoples R China
学科主题Physics, Multidisciplinary
收录类别SCI
语种英语
公开日期2012-03-24
源URL[http://ir.sim.ac.cn/handle/331004/95105]  
专题上海微系统与信息技术研究所_功能材料与器件_期刊论文
推荐引用方式
GB/T 7714
Wu, LC,Song, ZT,Liu, B,et al. Remarkable resistance change in plasma oxidized TiOx/TiNx film for memory application[J]. CHINESE PHYSICS LETTERS,2007,24(4):1103-1105.
APA Wu, LC.,Song, ZT.,Liu, B.,Rao, F.,Xu, C.,...&Feng, SL.(2007).Remarkable resistance change in plasma oxidized TiOx/TiNx film for memory application.CHINESE PHYSICS LETTERS,24(4),1103-1105.
MLA Wu, LC,et al."Remarkable resistance change in plasma oxidized TiOx/TiNx film for memory application".CHINESE PHYSICS LETTERS 24.4(2007):1103-1105.

入库方式: OAI收割

来源:上海微系统与信息技术研究所

浏览0
下载0
收藏0
其他版本

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。