中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Effect of AlN intermediate layer on growing GaN film by hydride vapor phase epitaxy

文献类型:期刊论文

作者Lin, CT ; Yu, GH ; Lei, BL ; Wang, XZ ; Ye, HH ; Meng, S ; Qi, M ; Li, AZ ; Nouet, G ; Ruterana, P ; Chen, J
刊名RARE METALS
出版日期2006
卷号25页码:15-19
关键词HIGH-QUALITY GAN BUFFER LAYER GROWTH DEPOSITION MORPHOLOGY EVOLUTION SAPPHIRE
ISSN号1001-0521
通讯作者Yu, GH, Chinese Acad Sci, Shanghai Inst Microsyst & Informat, State Key Lab Funct Mat Informat, Shanghai 200050, Peoples R China
学科主题Materials Science, Multidisciplinary; Metallurgy & Metallurgical Engineering
收录类别SCI
原文出处http://www.sciencedirect.com/science/article/pii/S1001052108600443
语种英语
公开日期2012-03-24
源URL[http://ir.sim.ac.cn/handle/331004/95220]  
专题上海微系统与信息技术研究所_功能材料与器件_期刊论文
推荐引用方式
GB/T 7714
Lin, CT,Yu, GH,Lei, BL,et al. Effect of AlN intermediate layer on growing GaN film by hydride vapor phase epitaxy[J]. RARE METALS,2006,25:15-19.
APA Lin, CT.,Yu, GH.,Lei, BL.,Wang, XZ.,Ye, HH.,...&Chen, J.(2006).Effect of AlN intermediate layer on growing GaN film by hydride vapor phase epitaxy.RARE METALS,25,15-19.
MLA Lin, CT,et al."Effect of AlN intermediate layer on growing GaN film by hydride vapor phase epitaxy".RARE METALS 25(2006):15-19.

入库方式: OAI收割

来源:上海微系统与信息技术研究所

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