中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Electrical properties of AlN thin films prepared by ion beam enhanced deposition

文献类型:期刊论文

作者An, ZG ; Men, CL ; Xu, ZK ; Chu, PK ; Lin, CL
刊名SURFACE & COATINGS TECHNOLOGY
出版日期2005
卷号196期号:1-3页码:130-134
关键词INSULATOR TEMPERATURE FABRICATION AIN
ISSN号0257-8972
通讯作者Chu, PK, City Univ Hong Kong, Dept Phys & Mat Sci, Tat Chee Ave, Kowloon, Hong Kong, Peoples R China
学科主题Materials Science, Coatings & Films; Physics, Applied
收录类别SCI
语种英语
公开日期2012-03-24
源URL[http://ir.sim.ac.cn/handle/331004/95263]  
专题上海微系统与信息技术研究所_功能材料与器件_期刊论文
推荐引用方式
GB/T 7714
An, ZG,Men, CL,Xu, ZK,et al. Electrical properties of AlN thin films prepared by ion beam enhanced deposition[J]. SURFACE & COATINGS TECHNOLOGY,2005,196(1-3):130-134.
APA An, ZG,Men, CL,Xu, ZK,Chu, PK,&Lin, CL.(2005).Electrical properties of AlN thin films prepared by ion beam enhanced deposition.SURFACE & COATINGS TECHNOLOGY,196(1-3),130-134.
MLA An, ZG,et al."Electrical properties of AlN thin films prepared by ion beam enhanced deposition".SURFACE & COATINGS TECHNOLOGY 196.1-3(2005):130-134.

入库方式: OAI收割

来源:上海微系统与信息技术研究所

浏览0
下载0
收藏0
其他版本

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。