中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Strain relaxation mechanism in SiGe-on-insulator fabricated by Ge condensation

文献类型:期刊论文

作者Di, ZF ; Huang, AP ; Chu, PK ; Zhang, M ; Liu, WL ; Song, ZT ; Luo, SH ; Lin, CL
刊名JOURNAL OF CRYSTAL GROWTH
出版日期2005
卷号281期号:2-4页码:275-280
关键词MOBILITY ENHANCEMENT RAMAN-SCATTERING HIGH-PERFORMANCE COMPLIANT OXIDE N-MOSFETS OXIDATION SUBSTRATE STABILITY ELECTRON ISLANDS
ISSN号0022-0248
通讯作者Chu, PK, City Univ Hong Kong, Dept Phys & Mat Sci, Tat Chee Ave, Kowloon, Hong Kong, Peoples R China
学科主题Crystallography; Materials Science, Multidisciplinary; Physics, Applied
收录类别SCI
语种英语
公开日期2012-03-24
源URL[http://ir.sim.ac.cn/handle/331004/95294]  
专题上海微系统与信息技术研究所_功能材料与器件_期刊论文
推荐引用方式
GB/T 7714
Di, ZF,Huang, AP,Chu, PK,et al. Strain relaxation mechanism in SiGe-on-insulator fabricated by Ge condensation[J]. JOURNAL OF CRYSTAL GROWTH,2005,281(2-4):275-280.
APA Di, ZF.,Huang, AP.,Chu, PK.,Zhang, M.,Liu, WL.,...&Lin, CL.(2005).Strain relaxation mechanism in SiGe-on-insulator fabricated by Ge condensation.JOURNAL OF CRYSTAL GROWTH,281(2-4),275-280.
MLA Di, ZF,et al."Strain relaxation mechanism in SiGe-on-insulator fabricated by Ge condensation".JOURNAL OF CRYSTAL GROWTH 281.2-4(2005):275-280.

入库方式: OAI收割

来源:上海微系统与信息技术研究所

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