中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
GSMBE growth and characterizations of AlInP/InGaAsP strain-compensated multiple-layer heterostructures

文献类型:期刊论文

作者Huang, ZC ; Wu, HZ ; Lao, YF ; Cao, M ; Liu, C
刊名JOURNAL OF CRYSTAL GROWTH
出版日期2005
卷号281期号:2-4页码:255-262
关键词MOLECULAR-BEAM EPITAXY X-RAY-DIFFRACTION GAS-SOURCE MBE MISFIT DISLOCATIONS LASERS INP DEFECTS
ISSN号0022-0248
通讯作者Wu, HZ, Chinese Acad Sci, Grad Sch, Shanghai Inst Microsyst & Informat Technol, State Key Lab Funct Mat Informat, Shanghai 200050, Peoples R China
学科主题Crystallography; Materials Science, Multidisciplinary; Physics, Applied
收录类别SCI
语种英语
公开日期2012-03-24
源URL[http://ir.sim.ac.cn/handle/331004/95339]  
专题上海微系统与信息技术研究所_功能材料与器件_期刊论文
推荐引用方式
GB/T 7714
Huang, ZC,Wu, HZ,Lao, YF,et al. GSMBE growth and characterizations of AlInP/InGaAsP strain-compensated multiple-layer heterostructures[J]. JOURNAL OF CRYSTAL GROWTH,2005,281(2-4):255-262.
APA Huang, ZC,Wu, HZ,Lao, YF,Cao, M,&Liu, C.(2005).GSMBE growth and characterizations of AlInP/InGaAsP strain-compensated multiple-layer heterostructures.JOURNAL OF CRYSTAL GROWTH,281(2-4),255-262.
MLA Huang, ZC,et al."GSMBE growth and characterizations of AlInP/InGaAsP strain-compensated multiple-layer heterostructures".JOURNAL OF CRYSTAL GROWTH 281.2-4(2005):255-262.

入库方式: OAI收割

来源:上海微系统与信息技术研究所

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