中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Interfacial characteristics of fully depleted SiGe-on-insulator (SGOI) substrate fabricated by modified Ge condensation

文献类型:期刊论文

作者Di, ZF ; Zhang, M ; Liu, WL ; Luo, SH ; Song, ZT ; Lin, CL ; Lin, Q ; Chu, PK
刊名SEMICONDUCTOR SCIENCE AND TECHNOLOGY
出版日期2005
卷号20期号:8页码:L31-L35
关键词ELECTRON-MOBILITY ENHANCEMENT STRAINED-SI DIFFUSION OXIDATION GERMANIUM SILICON ALLOYS
ISSN号0268-1242
通讯作者Di, ZF, Chinese Acad Sci, SIMIT, Res Ctr Semicond Funct Film Engn Technol, Shanghai 200050, Peoples R China
学科主题Engineering, Electrical & Electronic; Materials Science, Multidisciplinary; Physics, Condensed Matter
收录类别SCI
语种英语
公开日期2012-03-24
源URL[http://ir.sim.ac.cn/handle/331004/95346]  
专题上海微系统与信息技术研究所_功能材料与器件_期刊论文
推荐引用方式
GB/T 7714
Di, ZF,Zhang, M,Liu, WL,et al. Interfacial characteristics of fully depleted SiGe-on-insulator (SGOI) substrate fabricated by modified Ge condensation[J]. SEMICONDUCTOR SCIENCE AND TECHNOLOGY,2005,20(8):L31-L35.
APA Di, ZF.,Zhang, M.,Liu, WL.,Luo, SH.,Song, ZT.,...&Chu, PK.(2005).Interfacial characteristics of fully depleted SiGe-on-insulator (SGOI) substrate fabricated by modified Ge condensation.SEMICONDUCTOR SCIENCE AND TECHNOLOGY,20(8),L31-L35.
MLA Di, ZF,et al."Interfacial characteristics of fully depleted SiGe-on-insulator (SGOI) substrate fabricated by modified Ge condensation".SEMICONDUCTOR SCIENCE AND TECHNOLOGY 20.8(2005):L31-L35.

入库方式: OAI收割

来源:上海微系统与信息技术研究所

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