中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Research on the effect of nitrogen implantation doses on the structure of separation by implantation of oxygen and nitrogen

文献类型:期刊论文

作者Zhang, EX ; Yi, WB ; Chen, J ; Zhang, ZX ; Wang, X
刊名SMART MATERIALS & STRUCTURES
出版日期2005
卷号14期号:4页码:N42-N45
关键词ION-BEAM SYNTHESIS BURIED LAYERS SILICON
ISSN号0964-1726
通讯作者Zhang, EX, Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, Ion Beam Lab, Shanghai 20050, Peoples R China
学科主题Instruments & Instrumentation; Materials Science, Multidisciplinary
收录类别SCI
语种英语
公开日期2012-03-24
源URL[http://ir.sim.ac.cn/handle/331004/95353]  
专题上海微系统与信息技术研究所_功能材料与器件_期刊论文
推荐引用方式
GB/T 7714
Zhang, EX,Yi, WB,Chen, J,et al. Research on the effect of nitrogen implantation doses on the structure of separation by implantation of oxygen and nitrogen[J]. SMART MATERIALS & STRUCTURES,2005,14(4):N42-N45.
APA Zhang, EX,Yi, WB,Chen, J,Zhang, ZX,&Wang, X.(2005).Research on the effect of nitrogen implantation doses on the structure of separation by implantation of oxygen and nitrogen.SMART MATERIALS & STRUCTURES,14(4),N42-N45.
MLA Zhang, EX,et al."Research on the effect of nitrogen implantation doses on the structure of separation by implantation of oxygen and nitrogen".SMART MATERIALS & STRUCTURES 14.4(2005):N42-N45.

入库方式: OAI收割

来源:上海微系统与信息技术研究所

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