中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Microwave characterization of (Pb,La)TiO3 thin films integrated on ZrO2/SiO2/Si wafers by sol-gel techniques

文献类型:期刊论文

作者Song, ZT ; Wang, Y ; Chan, HLW ; Choy, CL ; Feng, SL
刊名APPLIED PHYSICS LETTERS
出版日期2004
卷号85期号:20页码:4696-4698
关键词INTERDIGITAL CAPACITORS TEMPERATURE FATIGUE DEVICES SENSOR (PB
ISSN号0003-6951
通讯作者Song, ZT, Hong Kong Polytech Univ, Dept Appl Phys, Hong Kong, Hong Kong, Peoples R China
学科主题Physics, Applied
收录类别SCI
语种英语
公开日期2012-03-24
源URL[http://ir.sim.ac.cn/handle/331004/95462]  
专题上海微系统与信息技术研究所_功能材料与器件_期刊论文
推荐引用方式
GB/T 7714
Song, ZT,Wang, Y,Chan, HLW,et al. Microwave characterization of (Pb,La)TiO3 thin films integrated on ZrO2/SiO2/Si wafers by sol-gel techniques[J]. APPLIED PHYSICS LETTERS,2004,85(20):4696-4698.
APA Song, ZT,Wang, Y,Chan, HLW,Choy, CL,&Feng, SL.(2004).Microwave characterization of (Pb,La)TiO3 thin films integrated on ZrO2/SiO2/Si wafers by sol-gel techniques.APPLIED PHYSICS LETTERS,85(20),4696-4698.
MLA Song, ZT,et al."Microwave characterization of (Pb,La)TiO3 thin films integrated on ZrO2/SiO2/Si wafers by sol-gel techniques".APPLIED PHYSICS LETTERS 85.20(2004):4696-4698.

入库方式: OAI收割

来源:上海微系统与信息技术研究所

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