中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Composition, structure and optical properties of SiC buried layer formed by high dose carbon implantation into Si using metal vapor vacuum arc ion source

文献类型:期刊论文

作者Chen, DH ; Wong, SP ; Yang, SH ; Mo, D
刊名THIN SOLID FILMS
出版日期2003
卷号426期号:1-2页码:1-7
关键词BEAM SYNTHESIS SILICON XPS
ISSN号0040-6090
通讯作者Chen, DH, Zhongshan Univ, Sch Phys & Engn, Guangzhou 510275, Peoples R China
学科主题Materials Science, Multidisciplinary; Materials Science, Coatings & Films; Physics, Applied; Physics, Condensed Matter
收录类别SCI
语种英语
公开日期2012-03-24
源URL[http://ir.sim.ac.cn/handle/331004/95475]  
专题上海微系统与信息技术研究所_功能材料与器件_期刊论文
推荐引用方式
GB/T 7714
Chen, DH,Wong, SP,Yang, SH,et al. Composition, structure and optical properties of SiC buried layer formed by high dose carbon implantation into Si using metal vapor vacuum arc ion source[J]. THIN SOLID FILMS,2003,426(1-2):1-7.
APA Chen, DH,Wong, SP,Yang, SH,&Mo, D.(2003).Composition, structure and optical properties of SiC buried layer formed by high dose carbon implantation into Si using metal vapor vacuum arc ion source.THIN SOLID FILMS,426(1-2),1-7.
MLA Chen, DH,et al."Composition, structure and optical properties of SiC buried layer formed by high dose carbon implantation into Si using metal vapor vacuum arc ion source".THIN SOLID FILMS 426.1-2(2003):1-7.

入库方式: OAI收割

来源:上海微系统与信息技术研究所

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