中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Fabrication of device-grade silicon-on-insulator material from appropriate matches of low oxygen implantation dose and acceleration energy

文献类型:期刊论文

作者Chen, M ; Wang, X ; Chen, J ; Dong, YM ; Yi, WB ; Liu, XH ; Wang, X
刊名JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
出版日期2003
卷号21期号:5页码:2001-2010
关键词OXIDATION ITOX PROCESS BURIED OXIDE LAYERS SIMOX WAFERS ION-IMPLANTATION TEMPERATURE SEPARATION
ISSN号1071-1023
通讯作者Chen, M, Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, Shanghai 200050, Peoples R China
学科主题Engineering, Electrical & Electronic; Nanoscience & Nanotechnology; Physics, Applied
收录类别SCI
语种英语
公开日期2012-03-24
源URL[http://ir.sim.ac.cn/handle/331004/95525]  
专题上海微系统与信息技术研究所_功能材料与器件_期刊论文
推荐引用方式
GB/T 7714
Chen, M,Wang, X,Chen, J,et al. Fabrication of device-grade silicon-on-insulator material from appropriate matches of low oxygen implantation dose and acceleration energy[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,2003,21(5):2001-2010.
APA Chen, M.,Wang, X.,Chen, J.,Dong, YM.,Yi, WB.,...&Wang, X.(2003).Fabrication of device-grade silicon-on-insulator material from appropriate matches of low oxygen implantation dose and acceleration energy.JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,21(5),2001-2010.
MLA Chen, M,et al."Fabrication of device-grade silicon-on-insulator material from appropriate matches of low oxygen implantation dose and acceleration energy".JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B 21.5(2003):2001-2010.

入库方式: OAI收割

来源:上海微系统与信息技术研究所

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