中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Fabrication of device-grade separation-by-implantation-of-oxygen materials by optimizing dose-energy match

文献类型:期刊论文

作者Chen,M ; Yu,YH ; Wang,X ; Wang,X ; Chen,J ; Liu,XH ; Dong,YM
刊名JOURNAL OF MATERIALS RESEARCH
出版日期2002
卷号17期号:7页码:1634-1643
关键词BURIED OXIDE ION-IMPLANTATION SIMOX SILICON LAYERS TEMPERATURE WAFERS
ISSN号0884-2914
通讯作者Chen, M, Chinese Acad Sci, Shanghai Inst Met, Ion Beam Lab, Shanghai 200050, Peoples R China
学科主题Materials Science ; Multidisciplinary
收录类别SCI
公开日期2012-03-24
源URL[http://ir.sim.ac.cn/handle/331004/95572]  
专题上海微系统与信息技术研究所_功能材料与器件_期刊论文
推荐引用方式
GB/T 7714
Chen,M,Yu,YH,Wang,X,et al. Fabrication of device-grade separation-by-implantation-of-oxygen materials by optimizing dose-energy match[J]. JOURNAL OF MATERIALS RESEARCH,2002,17(7):1634-1643.
APA Chen,M.,Yu,YH.,Wang,X.,Wang,X.,Chen,J.,...&Dong,YM.(2002).Fabrication of device-grade separation-by-implantation-of-oxygen materials by optimizing dose-energy match.JOURNAL OF MATERIALS RESEARCH,17(7),1634-1643.
MLA Chen,M,et al."Fabrication of device-grade separation-by-implantation-of-oxygen materials by optimizing dose-energy match".JOURNAL OF MATERIALS RESEARCH 17.7(2002):1634-1643.

入库方式: OAI收割

来源:上海微系统与信息技术研究所

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