Studying the high-field electron conduction of tetrahedral amorphous carbon thin films by conducting atomic force microscopy
文献类型：期刊论文
| 作者 | Luo, EZ ; Lin, S ; Xie, Z ; Xu, JB ; Wilson, IH ; Yu, YH ; Yu, LJ ; Wang, X |
| 刊名 | MATERIALS CHARACTERIZATION
 |
| 出版日期 | 2002 |
| 卷号 | 48期号:2-3页码:205-210 |
| 关键词 | EMISSION MECHANISMS DIAMOND |
| ISSN号 | 1044-5803 |
| 通讯作者 | Luo, EZ, Chinese Univ Hong Kong, Dept Elect Engn, Hong Kong, Hong Kong, Peoples R China |
| 学科主题 | Materials Science, Characterization & Testing |
| 收录类别 | SCI |
| 语种 | 英语 |
| 公开日期 | 2012-03-24 |
| 源URL | [http://ir.sim.ac.cn/handle/331004/95634]  |
| 专题 | 上海微系统与信息技术研究所_功能材料与器件_期刊论文 |
| 推荐引用方式 GB/T 7714 | Luo, EZ,Lin, S,Xie, Z,et al. Studying the high-field electron conduction of tetrahedral amorphous carbon thin films by conducting atomic force microscopy[J]. MATERIALS CHARACTERIZATION,2002,48(2-3):205-210. |
| APA | Luo, EZ.,Lin, S.,Xie, Z.,Xu, JB.,Wilson, IH.,...&Wang, X.(2002).Studying the high-field electron conduction of tetrahedral amorphous carbon thin films by conducting atomic force microscopy.MATERIALS CHARACTERIZATION,48(2-3),205-210. |
| MLA | Luo, EZ,et al."Studying the high-field electron conduction of tetrahedral amorphous carbon thin films by conducting atomic force microscopy".MATERIALS CHARACTERIZATION 48.2-3(2002):205-210. |
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