中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Comparison between the different implantation orders in H+ and He+ coimplantation

文献类型:期刊论文

作者Duo, XZ ; Liu, WL ; Zhang, MA ; Wang, LW ; Lin, CL ; Okuyama, M ; Noda, M ; Cheung, WY ; Chu, PK ; Hu, PG ; Wang, SX ; Wang, LM
刊名JOURNAL OF PHYSICS D-APPLIED PHYSICS
出版日期2001
卷号34期号:4页码:477-482
关键词POSITRON-ANNIHILATION INDUCED DEFECTS SILICON EXFOLIATION MECHANISM CAVITIES AU
ISSN号0022-3727
通讯作者Duo, XZ, Chinese Acad Sci, Shanghai Inst Met, Shanghai 200050, Peoples R China
学科主题Physics, Applied
收录类别SCI
语种英语
公开日期2012-03-24
源URL[http://ir.sim.ac.cn/handle/331004/95699]  
专题上海微系统与信息技术研究所_功能材料与器件_期刊论文
推荐引用方式
GB/T 7714
Duo, XZ,Liu, WL,Zhang, MA,et al. Comparison between the different implantation orders in H+ and He+ coimplantation[J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS,2001,34(4):477-482.
APA Duo, XZ.,Liu, WL.,Zhang, MA.,Wang, LW.,Lin, CL.,...&Wang, LM.(2001).Comparison between the different implantation orders in H+ and He+ coimplantation.JOURNAL OF PHYSICS D-APPLIED PHYSICS,34(4),477-482.
MLA Duo, XZ,et al."Comparison between the different implantation orders in H+ and He+ coimplantation".JOURNAL OF PHYSICS D-APPLIED PHYSICS 34.4(2001):477-482.

入库方式: OAI收割

来源:上海微系统与信息技术研究所

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