中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Silicon behavior in GaN grown by radiofrequency plasma molecular beam epitaxy

文献类型:期刊论文

作者Li, W ; Li, AZ
刊名THIN SOLID FILMS
出版日期2001
卷号401期号:1-2页码:279-283
关键词SI-DOPED GAN CHEMICAL-VAPOR-DEPOSITION PHOTOLUMINESCENCE SPECTROSCOPY PHOTO-LUMINESCENCE N-TYPE GAAS FILMS TRANSITIONS NITRIDE ENERGY
ISSN号0040-6090
通讯作者Li, AZ, Chinese Acad Sci, Shanghai Inst Met, State Key Lab Funct Mat Informat, Shanghai 200050, Peoples R China
学科主题Materials Science, Multidisciplinary; Materials Science, Coatings & Films; Physics, Applied; Physics, Condensed Matter
收录类别SCI
语种英语
公开日期2012-03-24
源URL[http://ir.sim.ac.cn/handle/331004/95715]  
专题上海微系统与信息技术研究所_功能材料与器件_期刊论文
推荐引用方式
GB/T 7714
Li, W,Li, AZ. Silicon behavior in GaN grown by radiofrequency plasma molecular beam epitaxy[J]. THIN SOLID FILMS,2001,401(1-2):279-283.
APA Li, W,&Li, AZ.(2001).Silicon behavior in GaN grown by radiofrequency plasma molecular beam epitaxy.THIN SOLID FILMS,401(1-2),279-283.
MLA Li, W,et al."Silicon behavior in GaN grown by radiofrequency plasma molecular beam epitaxy".THIN SOLID FILMS 401.1-2(2001):279-283.

入库方式: OAI收割

来源:上海微系统与信息技术研究所

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