中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Intense UV-visible photoluminescence from Si+ and N+ co-implanted thermal SiO2 films

文献类型:期刊论文

作者Yu,YH ; Li,L ; Lei,YM ; Zhao,J ; Mao,DS ; Zou,SC ; Sundaraval,B ; Luo,EZ ; Wong,SP ; Xu,JB ; Wilson,IH
刊名2000 INTERNATIONAL CONFERENCE ON ION IMPLANTATION TECHNOLOGY, PROCEEDINGS
出版日期2000
期号0页码:765-768
关键词LAYERS
通讯作者Yu, YH, Acad Sinica, Shanghai Inst Met, Ion Beam Lab, Shanghai 200050, Peoples R China
学科主题Computer Science ; Hardware & Architecture; Engineering ; Electrical & Electronic
收录类别SCI
公开日期2012-03-24
源URL[http://ir.sim.ac.cn/handle/331004/95836]  
专题上海微系统与信息技术研究所_功能材料与器件_期刊论文
推荐引用方式
GB/T 7714
Yu,YH,Li,L,Lei,YM,et al. Intense UV-visible photoluminescence from Si+ and N+ co-implanted thermal SiO2 films[J]. 2000 INTERNATIONAL CONFERENCE ON ION IMPLANTATION TECHNOLOGY, PROCEEDINGS,2000(0):765-768.
APA Yu,YH.,Li,L.,Lei,YM.,Zhao,J.,Mao,DS.,...&Wilson,IH.(2000).Intense UV-visible photoluminescence from Si+ and N+ co-implanted thermal SiO2 films.2000 INTERNATIONAL CONFERENCE ON ION IMPLANTATION TECHNOLOGY, PROCEEDINGS(0),765-768.
MLA Yu,YH,et al."Intense UV-visible photoluminescence from Si+ and N+ co-implanted thermal SiO2 films".2000 INTERNATIONAL CONFERENCE ON ION IMPLANTATION TECHNOLOGY, PROCEEDINGS .0(2000):765-768.

入库方式: OAI收割

来源:上海微系统与信息技术研究所

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