中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Development of biosensor based on imaging ellipsometry and biomedical applications

文献类型:会议论文

作者Niu Y(牛宇); Jin G(靳刚); Meng YH(孟永宏); Chen S(陈涉); Liu L(刘丽)
出版日期2011
会议名称5th International Conference on Spectroscopic Ellipsometry
会议日期MAY 23-29, 2010
会议地点Albany, NY
通讯作者邮箱gajin@imech.ac.cn
关键词Imaging ellipsometry Biosensor Protein microarray Total internal reflection OFF-NULL ELLIPSOMETRY OPTICAL PROTEIN-CHIP OPTIMIZATION VISUALIZATION
卷号519
期号9
页码2750-2757
通讯作者Jin, G (reprint author), Chinese Acad Sci, NML, Inst Mech, 15 Bei Si Huan W Rd, Beijing 100190, Peoples R China
中文摘要So far, combined with a microfluidic reactor array system, an engineering system of biosensor based on imaging ellipsometry is installed for biomedical applications, such as antibody screen, hepatitis B markers detection, cancer markers spectrum and virus recognition, etc. Furthermore, the biosensor in total internal reflection (TIR) mode has be improved by a spectroscopic light, optimization settings of polarization and low noise CCD which brings an obvious improvement of 10 time increase in the sensitivity and SNR, and 50 times lower concentration in the detection limit with a throughput of 48 independent channels and the time resolution of 0.04 S. (C) 2010 Elsevier B.V. All rights reserved.
合作状况国内
产权排序Chinese Acad Sci, NML, Inst Mech, Beijing 100190, Peoples R China; Chinese Acad Sci, Inst Biophys, Beijing 100101, Peoples R China
会议主办者Univ Albany, Coll Nanoscale & Engn
会议网址http://dx.doi.org/10.1016/j.tsf.2010.12.175
会议录THIN SOLID FILMS
会议录出版者ELSEVIER SCIENCE SA
学科主题Materials Science ; Multidisciplinary; Materials Science ; Coatings & Films; Physics ; Applied; Physics ; Condensed Matter
会议录出版地PO BOX 564, 1001 LAUSANNE, SWITZERLAND
语种英语
ISSN号0040-6090
源URL[http://dspace.imech.ac.cn/handle/311007/45317]  
专题力学研究所_国家微重力实验室
推荐引用方式
GB/T 7714
Niu Y,Jin G,Meng YH,et al. Development of biosensor based on imaging ellipsometry and biomedical applications[C]. 见:5th International Conference on Spectroscopic Ellipsometry. Albany, NY. MAY 23-29, 2010.http://dx.doi.org/10.1016/j.tsf.2010.12.175.

入库方式: OAI收割

来源:力学研究所

浏览0
下载0
收藏0
其他版本

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。