Development of biosensor based on imaging ellipsometry and biomedical applications
文献类型:会议论文
作者 | Niu Y(牛宇)![]() ![]() ![]() ![]() ![]() |
出版日期 | 2011 |
会议名称 | 5th International Conference on Spectroscopic Ellipsometry |
会议日期 | MAY 23-29, 2010 |
会议地点 | Albany, NY |
通讯作者邮箱 | gajin@imech.ac.cn |
关键词 | Imaging ellipsometry Biosensor Protein microarray Total internal reflection OFF-NULL ELLIPSOMETRY OPTICAL PROTEIN-CHIP OPTIMIZATION VISUALIZATION |
卷号 | 519 |
期号 | 9 |
页码 | 2750-2757 |
通讯作者 | Jin, G (reprint author), Chinese Acad Sci, NML, Inst Mech, 15 Bei Si Huan W Rd, Beijing 100190, Peoples R China |
中文摘要 | So far, combined with a microfluidic reactor array system, an engineering system of biosensor based on imaging ellipsometry is installed for biomedical applications, such as antibody screen, hepatitis B markers detection, cancer markers spectrum and virus recognition, etc. Furthermore, the biosensor in total internal reflection (TIR) mode has be improved by a spectroscopic light, optimization settings of polarization and low noise CCD which brings an obvious improvement of 10 time increase in the sensitivity and SNR, and 50 times lower concentration in the detection limit with a throughput of 48 independent channels and the time resolution of 0.04 S. (C) 2010 Elsevier B.V. All rights reserved. |
合作状况 | 国内 |
产权排序 | Chinese Acad Sci, NML, Inst Mech, Beijing 100190, Peoples R China; Chinese Acad Sci, Inst Biophys, Beijing 100101, Peoples R China |
会议主办者 | Univ Albany, Coll Nanoscale & Engn |
会议网址 | http://dx.doi.org/10.1016/j.tsf.2010.12.175 |
会议录 | THIN SOLID FILMS
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会议录出版者 | ELSEVIER SCIENCE SA |
学科主题 | Materials Science ; Multidisciplinary; Materials Science ; Coatings & Films; Physics ; Applied; Physics ; Condensed Matter |
会议录出版地 | PO BOX 564, 1001 LAUSANNE, SWITZERLAND |
语种 | 英语 |
ISSN号 | 0040-6090 |
源URL | [http://dspace.imech.ac.cn/handle/311007/45317] ![]() |
专题 | 力学研究所_国家微重力实验室 |
推荐引用方式 GB/T 7714 | Niu Y,Jin G,Meng YH,et al. Development of biosensor based on imaging ellipsometry and biomedical applications[C]. 见:5th International Conference on Spectroscopic Ellipsometry. Albany, NY. MAY 23-29, 2010.http://dx.doi.org/10.1016/j.tsf.2010.12.175. |
入库方式: OAI收割
来源:力学研究所
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