中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Improved NiSi0.8Ge0.2/Si0.8Ge0.2 Contacts by C+ Pre-Implantation

文献类型:期刊论文

作者Zhang,B ; Yu,W ; Zhao,QT ; Buca,D ; Hollander,B ; Hartmann,JM ; Zhang,M ; Wang,X ; Mantl,S
刊名ELECTROCHEMICAL AND SOLID STATE LETTERS
出版日期2011
卷号14期号:7页码:H261-H263
关键词ELECTROCHEMICAL SOC INC
ISSN号1099-0062
学科主题Electrochemistry; Materials Science ; Multidisciplinary
公开日期2012-04-10
源URL[http://ir.sim.ac.cn/handle/331004/106790]  
专题上海微系统与信息技术研究所_功能材料与器件_期刊论文
推荐引用方式
GB/T 7714
Zhang,B,Yu,W,Zhao,QT,et al. Improved NiSi0.8Ge0.2/Si0.8Ge0.2 Contacts by C+ Pre-Implantation[J]. ELECTROCHEMICAL AND SOLID STATE LETTERS,2011,14(7):H261-H263.
APA Zhang,B.,Yu,W.,Zhao,QT.,Buca,D.,Hollander,B.,...&Mantl,S.(2011).Improved NiSi0.8Ge0.2/Si0.8Ge0.2 Contacts by C+ Pre-Implantation.ELECTROCHEMICAL AND SOLID STATE LETTERS,14(7),H261-H263.
MLA Zhang,B,et al."Improved NiSi0.8Ge0.2/Si0.8Ge0.2 Contacts by C+ Pre-Implantation".ELECTROCHEMICAL AND SOLID STATE LETTERS 14.7(2011):H261-H263.

入库方式: OAI收割

来源:上海微系统与信息技术研究所

浏览0
下载0
收藏0
其他版本

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。