中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Investigation of strain-relaxed SiGe thin film grown on ion-implanted Si compliant substrate

文献类型:期刊论文

作者Chen, CC ; Yu, BH ; Liu, JF ; Cao, JQ(曹建清) ; Zhu, DZ(朱德彰) ; Liu, ZH
刊名NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
出版日期2005
卷号239期号:4页码:433
关键词strain relaxation UHVCVD ion implantation SiGe
ISSN号0168-583X
通讯作者Chen, CC (reprint author), XinYang Normal Univ, Coll Phys & Elect Engn, XinYang 464000, Peoples R China
学科主题Chemistry
收录类别SCI
语种英语
公开日期2012-05-03
源URL[http://ir.sinap.ac.cn/handle/331007/8084]  
专题上海应用物理研究所_中科院上海应用物理研究所2004-2010年
推荐引用方式
GB/T 7714
Chen, CC,Yu, BH,Liu, JF,et al. Investigation of strain-relaxed SiGe thin film grown on ion-implanted Si compliant substrate[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,2005,239(4):433.
APA Chen, CC,Yu, BH,Liu, JF,Cao, JQ,Zhu, DZ,&Liu, ZH.(2005).Investigation of strain-relaxed SiGe thin film grown on ion-implanted Si compliant substrate.NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,239(4),433.
MLA Chen, CC,et al."Investigation of strain-relaxed SiGe thin film grown on ion-implanted Si compliant substrate".NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS 239.4(2005):433.

入库方式: OAI收割

来源:上海应用物理研究所

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