中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Investigation on reflection tomography imaging with terahertz wave of nonparallel interfaces inside the sample

文献类型:期刊论文

作者Xi, ZJ(席再军) ; Xiao, TQ(肖体乔) ; Zhang, ZY(张增艳) ; Chen, M(陈敏) ; Yu, XH ; Xu(余笑寒), HJ(胡钧)
刊名ACTA PHYSICA SINICA
出版日期2006
卷号55期号:5页码:2293
关键词terahertz wave reflection tomography imaging
ISSN号1000-3290
通讯作者Xi, ZJ (reprint author), Chinese Acad Sci, Shanghai Inst Appl Phys, Shanghai 201800, Peoples R China
学科主题Science & Technology - Other Topics; Materials Science; Physics
收录类别SCI
语种英语
公开日期2012-05-11
源URL[http://ir.sinap.ac.cn/handle/331007/8302]  
专题上海应用物理研究所_中科院上海应用物理研究所2004-2010年
推荐引用方式
GB/T 7714
Xi, ZJ,Xiao, TQ,Zhang, ZY,et al. Investigation on reflection tomography imaging with terahertz wave of nonparallel interfaces inside the sample[J]. ACTA PHYSICA SINICA,2006,55(5):2293.
APA Xi, ZJ,Xiao, TQ,Zhang, ZY,Chen, M,Yu, XH,&Xu.(2006).Investigation on reflection tomography imaging with terahertz wave of nonparallel interfaces inside the sample.ACTA PHYSICA SINICA,55(5),2293.
MLA Xi, ZJ,et al."Investigation on reflection tomography imaging with terahertz wave of nonparallel interfaces inside the sample".ACTA PHYSICA SINICA 55.5(2006):2293.

入库方式: OAI收割

来源:上海应用物理研究所

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