TEM observation of tin whisker
文献类型：期刊论文
| 作者 | M. Liu ; A. P. Xian |
| 刊名 | Science China-Technological Sciences
 |
| 出版日期 | 2011 |
| 卷号 | 54期号:6页码:1546-1550 |
| 关键词 | tin whiskers transmission electron microscope electron-microscopy growth |
| ISSN号 | 1674-7321 |
| 中文摘要 | The tin whiskers spontaneously grew from the NdSn(3) intermetallic compound (IMC) after exposure to ambient conditions. One such fine tin whisker with a diameter of about 600 nm was observed by transmission electron microscope (TEM). The results showed the whisker was a perfect beta-Sn single-crystal without dislocations or low angle grain boundaries. The whisker growth axis was calculated as [111]. There were interference fringes in the bright-field image of the tin whisker, which reflected the existence of growth stress in the whisker. A 15-18 nm native tin-oxide film on the tin whisker containing many crystal defects was also found. The new results are helpful in understanding the tin whisker growth mechanism. |
| 原文出处 | |
| 公开日期 | 2012-04-13 |
| 源URL | [http://210.72.142.130/handle/321006/30539]  |
| 专题 | 金属研究所_中国科学院金属研究所 |
| 推荐引用方式 GB/T 7714 | M. Liu,A. P. Xian. TEM observation of tin whisker[J]. Science China-Technological Sciences,2011,54(6):1546-1550. |
| APA | M. Liu,&A. P. Xian.(2011).TEM observation of tin whisker.Science China-Technological Sciences,54(6),1546-1550. |
| MLA | M. Liu,et al."TEM observation of tin whisker".Science China-Technological Sciences 54.6(2011):1546-1550. |
入库方式： OAI收割
来源：金属研究所
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