The 60 degrees or 180 degrees twinned Bi-doped PbTe film studied by EBSD
文献类型：期刊论文
| 作者 | S. Y. Ren ; Y. K. Yang ; H. D. Li ; D. M. Li ; X. Y. Lv ; P. W. Zhu |
| 刊名 | Applied Surface Science
 |
| 出版日期 | 2010 |
| 卷号 | 257期号:1页码:271-275 |
| 关键词 | Bi-doped PbTe Hot wall epitaxy EBSD Twins Orientation infrared detectors silicon si(100) si(111) |
| ISSN号 | 0169-4332 |
| 中文摘要 | The Bi-doped PbTe film was grown on Si(1 1 1) substrate by using hot wall epitaxy (HWE) technique. The film was characterized by means of scanning electron microscopy, micro-area X-ray diffraction and electron backscatter diffraction (EBSD). The results indicate that the film is dominated by < 111 > orientation. The film consists of two twinned domains, rotated 60 degrees or 180 degrees around the normal to the film surface. It is speculated that the twinned PbTe film results from the deviated triangular grains. The ratio between the grains with two different orientations will decrease with the increase of the film thickness. Crown Copyright (C) 2010 Published by Elsevier B. V. All rights reserved. |
| 原文出处 | |
| 公开日期 | 2012-04-13 |
| 源URL | [http://210.72.142.130/handle/321006/31420]  |
| 专题 | 金属研究所_中国科学院金属研究所 |
| 推荐引用方式 GB/T 7714 | S. Y. Ren,Y. K. Yang,H. D. Li,et al. The 60 degrees or 180 degrees twinned Bi-doped PbTe film studied by EBSD[J]. Applied Surface Science,2010,257(1):271-275. |
| APA | S. Y. Ren,Y. K. Yang,H. D. Li,D. M. Li,X. Y. Lv,&P. W. Zhu.(2010).The 60 degrees or 180 degrees twinned Bi-doped PbTe film studied by EBSD.Applied Surface Science,257(1),271-275. |
| MLA | S. Y. Ren,et al."The 60 degrees or 180 degrees twinned Bi-doped PbTe film studied by EBSD".Applied Surface Science 257.1(2010):271-275. |
入库方式： OAI收割
来源：金属研究所
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