RESIDUAL STRESS AND MAGNETIC PROPERTIES OF Fe-Ga THIN FILMS
文献类型:期刊论文
作者 | B. W. Wang ; S. Y. Cao ; W. M. Huang ; L. Weng ; Y. Sun |
刊名 | International Journal of Modern Physics B
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出版日期 | 2010 |
卷号 | 24期号:15-16页码:2380-2385 |
关键词 | Fe-Ga thin film residual stress magnetic property magnetostriction magnetostriction alloys |
ISSN号 | 0217-9792 |
中文摘要 | Fe-Ga thin films were prepared by DC magnetron sputtering on Si (100) substrate and an alloy target consisting of Fe(81)Ga(19) was used. X-ray diffraction techniques were used to quantify the strain in the Fe-Ga thin films by measuring the interplanar spacings of select crystallographic planes. The interplanar spacing, d, for the family of Fe-Ga {211} planes was measured. Using the well-established sin(2)psi technique, the residual stress of the Fe-Ga thin films was calculated. It has been found that the stress for Fe-Ga thin films quickly increases with increasing the sputtering power. The residual stress of thin films is almost unchanged in the range of 220-440 nm, and then it decreases with increasing the thickness of thin films. |
原文出处 | |
公开日期 | 2012-04-13 |
源URL | [http://ir.imr.ac.cn/handle/321006/31490] ![]() |
专题 | 金属研究所_中国科学院金属研究所 |
推荐引用方式 GB/T 7714 | B. W. Wang,S. Y. Cao,W. M. Huang,et al. RESIDUAL STRESS AND MAGNETIC PROPERTIES OF Fe-Ga THIN FILMS[J]. International Journal of Modern Physics B,2010,24(15-16):2380-2385. |
APA | B. W. Wang,S. Y. Cao,W. M. Huang,L. Weng,&Y. Sun.(2010).RESIDUAL STRESS AND MAGNETIC PROPERTIES OF Fe-Ga THIN FILMS.International Journal of Modern Physics B,24(15-16),2380-2385. |
MLA | B. W. Wang,et al."RESIDUAL STRESS AND MAGNETIC PROPERTIES OF Fe-Ga THIN FILMS".International Journal of Modern Physics B 24.15-16(2010):2380-2385. |
入库方式: OAI收割
来源:金属研究所
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