On the accuracy of maximum entropy reconstruction of high-resolution Z-contrast STEM images
文献类型：期刊论文
| 作者 | X. H. Sang ; K. Du ; M. J. Zhuo ; H. Q. Ye |
| 刊名 | Micron
 |
| 出版日期 | 2009 |
| 卷号 | 40期号:2页码:247-254 |
| 关键词 | Scanning transmission electron microscopy High-angle annular dark-field image (HAADF) Image processing Quantitative electron microscopy transmission electron-microscopy dark-field images grain-boundaries adf stem chemistry silicon |
| ISSN号 | 0968-4328 |
| 中文摘要 | The accuracy of maximum entropy reconstruction of Z-contrast STEM images has been evaluated with the effects of experimental variables and noise taken into account by the means of image simulation. As the specimen contains atom species of greatly different atomic numbers, special attention is given to the reliability of the position and composition of lighter atoms that are determined from Z-contrast images in the presence of heavier atoms. When the noise is moderate (SNR > 2.5), the position of atom columns can be measured within an accuracy of 0.03 nm. With a higher signal-to-noise ratio (SNR > 5) the composition of lighter atoms can be resolved reliably from the Z-contrast images. However, when image noise increases, the relative intensity of lighter atoms may deviate from the actual value in the specimen object function. (c) 2008 Elsevier Ltd. All rights reserved. |
| 原文出处 | |
| 公开日期 | 2012-04-13 |
| 源URL | [http://210.72.142.130/handle/321006/32259]  |
| 专题 | 金属研究所_中国科学院金属研究所 |
| 推荐引用方式 GB/T 7714 | X. H. Sang,K. Du,M. J. Zhuo,et al. On the accuracy of maximum entropy reconstruction of high-resolution Z-contrast STEM images[J]. Micron,2009,40(2):247-254. |
| APA | X. H. Sang,K. Du,M. J. Zhuo,&H. Q. Ye.(2009).On the accuracy of maximum entropy reconstruction of high-resolution Z-contrast STEM images.Micron,40(2),247-254. |
| MLA | X. H. Sang,et al."On the accuracy of maximum entropy reconstruction of high-resolution Z-contrast STEM images".Micron 40.2(2009):247-254. |
入库方式： OAI收割
来源：金属研究所
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