Characterization of oxygen vacancies and their migration in Ba-doped Pb(Zr(0.52)Ti(0.48))O(3) ferroelectrics
文献类型：期刊论文
| 作者 | M. F. Zhang ; Y. Wang ; K. F. Wang ; J. S. Zhu ; J. M. Liu |
| 刊名 | Journal of Applied Physics
 |
| 出版日期 | 2009 |
| 卷号 | 105期号:6 |
| 关键词 | barium dielectric losses dielectric polarisation dielectric relaxation doping profiles electrical conductivity ferroelectric ceramics ferroelectric thin films fluctuations lead compounds vacancies (crystal) lead-zirconate-titanate thin-films dielectric characterization single-crystal fatigue electrodes capacitors ceramics |
| ISSN号 | 0021-8979 |
| 中文摘要 | We investigate in detail the migration kinetics of oxygen vacancies (OVs) in Ba-doped Pb(Zr(0.52)Ti(0.48))O(3) (PZT) ferroelectrics by complex impedance spectroscopy. The temperature dependent dc-electrical conductivity sigma(dc) suggests that Ba doping into PZT can lower significantly the density of OVs, leading to the distinctly decreased sigma(dc) and slightly enhanced activation energy U for the migration of OVs, thus benefiting the polarization fatigue resistance. Furthermore, the polarization fluctuation induced by the relaxation of OVs is reduced by the Ba doping. The Cole-Cole fitting to the dielectric loss manifests strong correlation among OVs, and the migration of OVs appears to be a collective behavior. |
| 原文出处 | |
| 公开日期 | 2012-04-13 |
| 源URL | [http://210.72.142.130/handle/321006/32555]  |
| 专题 | 金属研究所_中国科学院金属研究所 |
| 推荐引用方式 GB/T 7714 | M. F. Zhang,Y. Wang,K. F. Wang,et al. Characterization of oxygen vacancies and their migration in Ba-doped Pb(Zr(0.52)Ti(0.48))O(3) ferroelectrics[J]. Journal of Applied Physics,2009,105(6). |
| APA | M. F. Zhang,Y. Wang,K. F. Wang,J. S. Zhu,&J. M. Liu.(2009).Characterization of oxygen vacancies and their migration in Ba-doped Pb(Zr(0.52)Ti(0.48))O(3) ferroelectrics.Journal of Applied Physics,105(6). |
| MLA | M. F. Zhang,et al."Characterization of oxygen vacancies and their migration in Ba-doped Pb(Zr(0.52)Ti(0.48))O(3) ferroelectrics".Journal of Applied Physics 105.6(2009). |
入库方式： OAI收割
来源：金属研究所
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