Image matching between experimental and simulated high-resolution electron micrographs of sapphire on the 0(1)over-bar10 orientation
文献类型：期刊论文
| 作者 | K. Du ; M. Ruhle |
| 刊名 | Journal of Microscopy
 |
| 出版日期 | 2008 |
| 卷号 | 232期号:1页码:137-144 |
| 关键词 | high-resolution transmission electron microscopy image simulation quantitative electron microscopy sapphire crystal defect structures hrem images interfaces hrtem retrieval alpha-al2o3 microscopy evolution package films |
| ISSN号 | 0022-2720 |
| 中文摘要 | The effects of imaging parameters have been studied on their roles of the severe mismatches between experimental and simulated high-resolution transmission electron micrographs of sapphire along the [0 (1) over bar 10] direction. Image simulation and convergent-beam electron diffraction techniques have been performed on misalignments of the electron beam and the crystal specimen. Based on this study, we have introduced an approach to achieve reliable simulation for experimental images of sapphire on the [0 (1) over bar 10] projection by the use of iterative digital image matching. |
| 原文出处 | |
| 公开日期 | 2012-04-13 |
| 源URL | [http://210.72.142.130/handle/321006/32723]  |
| 专题 | 金属研究所_中国科学院金属研究所 |
| 推荐引用方式 GB/T 7714 | K. Du,M. Ruhle. Image matching between experimental and simulated high-resolution electron micrographs of sapphire on the 0(1)over-bar10 orientation[J]. Journal of Microscopy,2008,232(1):137-144. |
| APA | K. Du,&M. Ruhle.(2008).Image matching between experimental and simulated high-resolution electron micrographs of sapphire on the 0(1)over-bar10 orientation.Journal of Microscopy,232(1),137-144. |
| MLA | K. Du,et al."Image matching between experimental and simulated high-resolution electron micrographs of sapphire on the 0(1)over-bar10 orientation".Journal of Microscopy 232.1(2008):137-144. |
入库方式： OAI收割
来源：金属研究所
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