中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Total color difference for rapid and accurate identification of graphene

文献类型:期刊论文

作者L. B. Gao ; W. C. Ren ; F. Li ; H. M. Cheng
刊名Acs Nano
出版日期2008
卷号2期号:8页码:1625-1633
关键词graphene total color difference number of layers substrate light source objective lens optical method films spectroscopy sheets layer
ISSN号1936-0851
中文摘要For rapid and accurate identification of graphenes by optical images, a total color difference (TCD) method is proposed and demonstrated based on a combination of reflection spectrum and International Commission on Illumination color space. The preferential thickness of different dielectric films covered on a Si substrate is well elucidated, and a 72 nm thick Al2O3 film is found to be much better than the commonly used SiO2 or Si3N4 films. The TCD both between monolayer graphene and substrate and between graphene of different layers (an be further improved by appropriately narrowing the wavelength range of the light source. Moreover, the influences of the objective lens in a real-world optical system on the TCD are also discussed. These findings provide useful information for rapid evaluation of the layer range of graphenes simply by different color bands and for accurate and reliable layer identification due to large TCD values, which opens up the possibility for the nondestructive identification and physical property measurements of graphene with an optical microscope.
原文出处://WOS:000258775000016
公开日期2012-04-13
源URL[http://210.72.142.130/handle/321006/32772]  
专题金属研究所_中国科学院金属研究所
推荐引用方式
GB/T 7714
L. B. Gao,W. C. Ren,F. Li,et al. Total color difference for rapid and accurate identification of graphene[J]. Acs Nano,2008,2(8):1625-1633.
APA L. B. Gao,W. C. Ren,F. Li,&H. M. Cheng.(2008).Total color difference for rapid and accurate identification of graphene.Acs Nano,2(8),1625-1633.
MLA L. B. Gao,et al."Total color difference for rapid and accurate identification of graphene".Acs Nano 2.8(2008):1625-1633.

入库方式: OAI收割

来源:金属研究所

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