Dynamical dislocation emission processes from twin boundaries
文献类型：期刊论文
| 作者 | Y. B. Wang ; B. Wu ; M. L. Sui |
| 刊名 | Applied Physics Letters
 |
| 出版日期 | 2008 |
| 卷号 | 93期号:4 |
| 关键词 | nanoscale twins bicrystal interfaces nanocrystalline al ultrahigh-strength rate sensitivity fcc metals copper deformation ductility nucleation |
| ISSN号 | 0003-6951 |
| 中文摘要 | In situ tensile straining transmission electron microscopy investigation of electrodeposited copper with high density of nanoscale growth twins reveals that twin boundaries (TBs) can serve as dislocation sources. Atomic steps at TBs formed by sessile Frank partial dislocations are beneficial for TBs serving as dislocation sources. The underlying mechanism that includes dislocation reactions with TBs is discussed. (C) 2008 American Institute of Physics. |
| 原文出处 | |
| 公开日期 | 2012-04-13 |
| 源URL | [http://210.72.142.130/handle/321006/33162]  |
| 专题 | 金属研究所_中国科学院金属研究所 |
| 推荐引用方式 GB/T 7714 | Y. B. Wang,B. Wu,M. L. Sui. Dynamical dislocation emission processes from twin boundaries[J]. Applied Physics Letters,2008,93(4). |
| APA | Y. B. Wang,B. Wu,&M. L. Sui.(2008).Dynamical dislocation emission processes from twin boundaries.Applied Physics Letters,93(4). |
| MLA | Y. B. Wang,et al."Dynamical dislocation emission processes from twin boundaries".Applied Physics Letters 93.4(2008). |
入库方式： OAI收割
来源：金属研究所
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