Microstructure and microanalysis of BaNb(0.2)Ti(0.8)O(3) thin film
文献类型：期刊论文
| 作者 | M. Zhang ; X. L. Ma ; D. X. Li ; S. J. Xie ; R. P. H. Chang |
| 刊名 | Materials Chemistry and Physics
 |
| 出版日期 | 2008 |
| 卷号 | 112期号:3页码:756-761 |
| 关键词 | Microstructure characterization Transmission electron microscopy Interface structure Defects Orientation relationship Perovskite thin films chemical-vapor-deposition molecular-beam epitaxy crystal-structure batio3 magnetoresistance nb yba2cu3o7-x oxide |
| ISSN号 | 0254-0584 |
| 中文摘要 | Perovskite-based BaNb(0.2)Ti(0.8)O(3) (BNTO) thin film, grown by computer-controlled laser molecular beam epitaxy on SrTiO(3) (001) substrate, was investigated by means of high-resolution electron microscopic (HREM) imaging, high-angle annular dark-field (HAADF) imaging, and X-ray energy dispersive spectrometric (XEDS) line-scanning in a transmission electron microscope. The microstructure of the BaNb(0.2)Ti(0.8)O(3) film is clarified in terms of various domains due to tetragonal characteristics. Compositional fluctuation was observed in the various domains and domain boundaries. The misfit strain and element diffusivity during the film growth together with inherent tetragonal characteristics are discussed as a possible mechanism for the formation and distribution of various domains. (C) 2008 Elsevier B.V. All rights reserved. |
| 原文出处 | |
| 公开日期 | 2012-04-13 |
| 源URL | [http://210.72.142.130/handle/321006/33328]  |
| 专题 | 金属研究所_中国科学院金属研究所 |
| 推荐引用方式 GB/T 7714 | M. Zhang,X. L. Ma,D. X. Li,et al. Microstructure and microanalysis of BaNb(0.2)Ti(0.8)O(3) thin film[J]. Materials Chemistry and Physics,2008,112(3):756-761. |
| APA | M. Zhang,X. L. Ma,D. X. Li,S. J. Xie,&R. P. H. Chang.(2008).Microstructure and microanalysis of BaNb(0.2)Ti(0.8)O(3) thin film.Materials Chemistry and Physics,112(3),756-761. |
| MLA | M. Zhang,et al."Microstructure and microanalysis of BaNb(0.2)Ti(0.8)O(3) thin film".Materials Chemistry and Physics 112.3(2008):756-761. |
入库方式： OAI收割
来源：金属研究所
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