中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Microstructural characteristics of epitaxial BaSrNb0.3Ti0.7O3 film

文献类型:期刊论文

作者L. N. Cheng ; X. L. Ma
刊名Journal of Materials Science & Technology
出版日期2007
卷号23期号:4页码:517-520
关键词BaSrNb0.3Ti0.7O3 thin film epitaxial growth transmission electron microscopy batio3 thin-films molecular-beam epitaxy crystal-structure nb srtio3
ISSN号1005-0302
中文摘要Microstructural characteristics in the (BaSrNb0.3TiO3)-O-0.7 thin film, grown on SrTi03 substrate by computer-controlled laser molecular beam epitaxy, were characterized by means of transmission electron microscopy (TEM). It is found that the film is single-crystallized and epitaxially grown on the SrTiO3 substrate forming a flat and distinct interface. Anti-phase domains were identified, and the crystallographic features of mismatch dislocations at the interface between film and substrate were clarified. The high conductivity of the present film was discussed from the viewpoint of Nb dopant and the nitrogen atmosphere.
原文出处://WOS:000248611900017
公开日期2012-04-13
源URL[http://ir.imr.ac.cn/handle/321006/33479]  
专题金属研究所_中国科学院金属研究所
推荐引用方式
GB/T 7714
L. N. Cheng,X. L. Ma. Microstructural characteristics of epitaxial BaSrNb0.3Ti0.7O3 film[J]. Journal of Materials Science & Technology,2007,23(4):517-520.
APA L. N. Cheng,&X. L. Ma.(2007).Microstructural characteristics of epitaxial BaSrNb0.3Ti0.7O3 film.Journal of Materials Science & Technology,23(4),517-520.
MLA L. N. Cheng,et al."Microstructural characteristics of epitaxial BaSrNb0.3Ti0.7O3 film".Journal of Materials Science & Technology 23.4(2007):517-520.

入库方式: OAI收割

来源:金属研究所

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