Microstructural characteristics of epitaxial BaSrNb0.3Ti0.7O3 film
文献类型:期刊论文
作者 | L. N. Cheng ; X. L. Ma |
刊名 | Journal of Materials Science & Technology
![]() |
出版日期 | 2007 |
卷号 | 23期号:4页码:517-520 |
关键词 | BaSrNb0.3Ti0.7O3 thin film epitaxial growth transmission electron microscopy batio3 thin-films molecular-beam epitaxy crystal-structure nb srtio3 |
ISSN号 | 1005-0302 |
中文摘要 | Microstructural characteristics in the (BaSrNb0.3TiO3)-O-0.7 thin film, grown on SrTi03 substrate by computer-controlled laser molecular beam epitaxy, were characterized by means of transmission electron microscopy (TEM). It is found that the film is single-crystallized and epitaxially grown on the SrTiO3 substrate forming a flat and distinct interface. Anti-phase domains were identified, and the crystallographic features of mismatch dislocations at the interface between film and substrate were clarified. The high conductivity of the present film was discussed from the viewpoint of Nb dopant and the nitrogen atmosphere. |
原文出处 | |
公开日期 | 2012-04-13 |
源URL | [http://ir.imr.ac.cn/handle/321006/33479] ![]() |
专题 | 金属研究所_中国科学院金属研究所 |
推荐引用方式 GB/T 7714 | L. N. Cheng,X. L. Ma. Microstructural characteristics of epitaxial BaSrNb0.3Ti0.7O3 film[J]. Journal of Materials Science & Technology,2007,23(4):517-520. |
APA | L. N. Cheng,&X. L. Ma.(2007).Microstructural characteristics of epitaxial BaSrNb0.3Ti0.7O3 film.Journal of Materials Science & Technology,23(4),517-520. |
MLA | L. N. Cheng,et al."Microstructural characteristics of epitaxial BaSrNb0.3Ti0.7O3 film".Journal of Materials Science & Technology 23.4(2007):517-520. |
入库方式: OAI收割
来源:金属研究所
浏览0
下载0
收藏0
其他版本
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。