Quantitative comparison of image contrast and pattern between experimental and simulated high-resolution transmission electron micrographs
文献类型：期刊论文
| 作者 | K. Du ; K. von Hochmeister ; F. Phillipp |
| 刊名 | Ultramicroscopy
 |
| 出版日期 | 2007 |
| 卷号 | 107期号:4-5页码:281-292 |
| 关键词 | high-resolution transmission electron microscopy image simulation atomic-resolution noise transfer ccd cameras hrem scattering microscope diffraction holography package signal |
| ISSN号 | 0304-3991 |
| 中文摘要 | Aiming to determine the contrast mismatch factor i.e. the Stobbs factor between the experimental and simulated high-resolution transmission electron micrographs, we have systematically compared the experimental images and simulations of a cleaved silicon sample for a series of focal settings and specimen thicknesses. For zero-loss energy filtered images, a mismatch factor of about 1.5-2.3 is measured for the image contrast, where the mismatch factor is focal dependent and higher mismatch appears around the focus value of 10 rim. Attention is also given to the effects of the sample vibration and drift to the image contrast and pattern of the high-resolution micrographs. (c) 2006 Elsevier B.V. All rights reserved. |
| 原文出处 | |
| 公开日期 | 2012-04-13 |
| 源URL | [http://ir.imr.ac.cn/handle/321006/33504]  |
| 专题 | 金属研究所_中国科学院金属研究所 |
| 推荐引用方式 GB/T 7714 | K. Du,K. von Hochmeister,F. Phillipp. Quantitative comparison of image contrast and pattern between experimental and simulated high-resolution transmission electron micrographs[J]. Ultramicroscopy,2007,107(4-5):281-292. |
| APA | K. Du,K. von Hochmeister,&F. Phillipp.(2007).Quantitative comparison of image contrast and pattern between experimental and simulated high-resolution transmission electron micrographs.Ultramicroscopy,107(4-5),281-292. |
| MLA | K. Du,et al."Quantitative comparison of image contrast and pattern between experimental and simulated high-resolution transmission electron micrographs".Ultramicroscopy 107.4-5(2007):281-292. |
入库方式： OAI收割
来源：金属研究所
浏览0
下载0
收藏0
其他版本
除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。