中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Identification of interfacial and bulk effects in modulating fatigue behaviors of Pb(Zr0.52Ti0.48)O-3 thin films

文献类型:期刊论文

作者Y. Wang ; F. Yuan ; T. Wei ; C. Zhu ; K. F. Wang ; Y. D. Xia ; J. M. Liu
刊名Journal of Applied Physics
出版日期2007
卷号101期号:1
关键词ferroelectric capacitors polarization fatigue srbi2ta2o9 electrodes charge scenarios memories model layer
ISSN号0021-8979
中文摘要The polarization fatigue behaviors of Pt/LaNiO3/Pb(Zr0.52Ti0.48)O-3/LaNiO3/Pt (Pt/LNO/PZT/LNO/Pt) and Pt/PZT/Pt structures under different temperatures T, voltages V-amp, and frequencies f are investigated in order to clarify defect-related interfacial and bulk effects. The fatigue endurance of the Pt/LNO/PZT/LNO/Pt structure is enhanced at higher T, larger V-amp, and lower f, whereas for the Pt/PZT/Pt structure a better antifatigue performance is obtained at lower T, smaller V-amp, and higher f. The defect chemistry as one of the origins of the switching fatigue is demonstrated by the predominant interfacial effect and bulk effect resulting in two types of markedly opposite fatigue responses. (c) 2007 American Institute of Physics.
原文出处://WOS:000243585200131
公开日期2012-04-13
源URL[http://ir.imr.ac.cn/handle/321006/33882]  
专题金属研究所_中国科学院金属研究所
推荐引用方式
GB/T 7714
Y. Wang,F. Yuan,T. Wei,et al. Identification of interfacial and bulk effects in modulating fatigue behaviors of Pb(Zr0.52Ti0.48)O-3 thin films[J]. Journal of Applied Physics,2007,101(1).
APA Y. Wang.,F. Yuan.,T. Wei.,C. Zhu.,K. F. Wang.,...&J. M. Liu.(2007).Identification of interfacial and bulk effects in modulating fatigue behaviors of Pb(Zr0.52Ti0.48)O-3 thin films.Journal of Applied Physics,101(1).
MLA Y. Wang,et al."Identification of interfacial and bulk effects in modulating fatigue behaviors of Pb(Zr0.52Ti0.48)O-3 thin films".Journal of Applied Physics 101.1(2007).

入库方式: OAI收割

来源:金属研究所

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