Defect-induced charge-order melting in thin films of Pr0.5Ca0.5MnO3
文献类型：期刊论文
| 作者 | Y. Q. Zhang ; Y. L. Zhu ; Z. D. Zhang ; J. Aarts |
| 刊名 | Journal of Applied Physics
 |
| 出版日期 | 2007 |
| 卷号 | 101期号:6 |
| 关键词 | magnetic-field |
| ISSN号 | 0021-8979 |
| 中文摘要 | We have investigated the relation between defect structure and charge order melting in thin films of epitaxial Pr0.5Ca0.5MnO3 (PCMO), grown under strain on SrTiO3. We compared the behavior of an 80 nm film grown in one deposition step at 840 degrees C with the behavior of a film grown in two steps. In the two-step case, a thin PCMO layer of 10 nm was deposited at 120 degrees C, followed by 70 nm deposited at 840 degrees C. The increase of the growth temperature leads to complete crystallization of the first layer and the lattice constants of the two-step grown film indicate that tensile strain is still present. On the other hand, a magnetic field of only 5 T is required to melt the charge-order state in the two-step grown film, which is a much lower than the value for the normally grown film. This appears to be connected to a larger amount of threading dislocations present in the first (recrystallized) layer. (c) 2007 American Institute of Physics. |
| 原文出处 | |
| 公开日期 | 2012-04-13 |
| 源URL | [http://ir.imr.ac.cn/handle/321006/34059]  |
| 专题 | 金属研究所_中国科学院金属研究所 |
| 推荐引用方式 GB/T 7714 | Y. Q. Zhang,Y. L. Zhu,Z. D. Zhang,et al. Defect-induced charge-order melting in thin films of Pr0.5Ca0.5MnO3[J]. Journal of Applied Physics,2007,101(6). |
| APA | Y. Q. Zhang,Y. L. Zhu,Z. D. Zhang,&J. Aarts.(2007).Defect-induced charge-order melting in thin films of Pr0.5Ca0.5MnO3.Journal of Applied Physics,101(6). |
| MLA | Y. Q. Zhang,et al."Defect-induced charge-order melting in thin films of Pr0.5Ca0.5MnO3".Journal of Applied Physics 101.6(2007). |
入库方式： OAI收割
来源：金属研究所
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