中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Structure and tribology property of carbon nitride films deposited by MW-ECR plasma enhanced unbalanced magnetron sputtering

文献类型:期刊论文

作者P. Gao ; J. Xu ; Y. Piao ; W. Y. Ding ; X. L. Deng ; C. Dong
刊名Plasma Science & Technology
出版日期2006
卷号8期号:4页码:425-428
关键词carbon nitride tribological property unbalanced magnetron sputtering cyclotron-resonance plasma raman-spectroscopy thin-films c-n nitrogen
ISSN号1009-0630
中文摘要Carbon nitride films were deposited by a twinned microwave electron cyclotron resonance (ECR) plasma source enhanced unbalanced magnetron sputtering system. The results indicate that the structure of the films is sensitive to the nitrogen content. The increase in the nitrogen flow ratio leads to an increase in the sp(3) content and an improvement of the tribological properties.
原文出处://WOS:000240571200012
公开日期2012-04-13
源URL[http://ir.imr.ac.cn/handle/321006/34214]  
专题金属研究所_中国科学院金属研究所
推荐引用方式
GB/T 7714
P. Gao,J. Xu,Y. Piao,et al. Structure and tribology property of carbon nitride films deposited by MW-ECR plasma enhanced unbalanced magnetron sputtering[J]. Plasma Science & Technology,2006,8(4):425-428.
APA P. Gao,J. Xu,Y. Piao,W. Y. Ding,X. L. Deng,&C. Dong.(2006).Structure and tribology property of carbon nitride films deposited by MW-ECR plasma enhanced unbalanced magnetron sputtering.Plasma Science & Technology,8(4),425-428.
MLA P. Gao,et al."Structure and tribology property of carbon nitride films deposited by MW-ECR plasma enhanced unbalanced magnetron sputtering".Plasma Science & Technology 8.4(2006):425-428.

入库方式: OAI收割

来源:金属研究所

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