中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Atomic scale characterization of layered ternary Cr2AlC ceramic

文献类型:期刊论文

作者Z. J. Lin ; M. J. Zhuo ; Y. C. Zhou ; M. S. Li ; J. Y. Wang
刊名Journal of Applied Physics
出版日期2006
卷号99期号:7
关键词liquid reaction synthesis transmission electron-microscope ab-initio calculations al-c ti2alc behavior films ti
ISSN号0021-8979
中文摘要Cr2AlC is a recently developed layered ternary carbide. In this work, the atomic scale microstructure is reported. The layer stacking sequence of Cr and Al atoms has been clearly resolved. The atomic scale characterizations were realized by means of high resolution transmission electron microscopy and Z-contrast scanning transmission electron microscopy. Furthermore, electron energy loss spectroscopic analysis revealed that the Cr-C bonds in Cr2AlC are characterized by a strong sigma bonding. (c) 2006 American Institute of Physics.
原文出处://WOS:000236770900073
公开日期2012-04-13
源URL[http://ir.imr.ac.cn/handle/321006/34337]  
专题金属研究所_中国科学院金属研究所
推荐引用方式
GB/T 7714
Z. J. Lin,M. J. Zhuo,Y. C. Zhou,et al. Atomic scale characterization of layered ternary Cr2AlC ceramic[J]. Journal of Applied Physics,2006,99(7).
APA Z. J. Lin,M. J. Zhuo,Y. C. Zhou,M. S. Li,&J. Y. Wang.(2006).Atomic scale characterization of layered ternary Cr2AlC ceramic.Journal of Applied Physics,99(7).
MLA Z. J. Lin,et al."Atomic scale characterization of layered ternary Cr2AlC ceramic".Journal of Applied Physics 99.7(2006).

入库方式: OAI收割

来源:金属研究所

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