Atomic scale characterization of layered ternary Cr2AlC ceramic
文献类型：期刊论文
| 作者 | Z. J. Lin ; M. J. Zhuo ; Y. C. Zhou ; M. S. Li ; J. Y. Wang |
| 刊名 | Journal of Applied Physics
 |
| 出版日期 | 2006 |
| 卷号 | 99期号:7 |
| 关键词 | liquid reaction synthesis transmission electron-microscope ab-initio calculations al-c ti2alc behavior films ti |
| ISSN号 | 0021-8979 |
| 中文摘要 | Cr2AlC is a recently developed layered ternary carbide. In this work, the atomic scale microstructure is reported. The layer stacking sequence of Cr and Al atoms has been clearly resolved. The atomic scale characterizations were realized by means of high resolution transmission electron microscopy and Z-contrast scanning transmission electron microscopy. Furthermore, electron energy loss spectroscopic analysis revealed that the Cr-C bonds in Cr2AlC are characterized by a strong sigma bonding. (c) 2006 American Institute of Physics. |
| 原文出处 | |
| 公开日期 | 2012-04-13 |
| 源URL | [http://ir.imr.ac.cn/handle/321006/34337]  |
| 专题 | 金属研究所_中国科学院金属研究所 |
| 推荐引用方式 GB/T 7714 | Z. J. Lin,M. J. Zhuo,Y. C. Zhou,et al. Atomic scale characterization of layered ternary Cr2AlC ceramic[J]. Journal of Applied Physics,2006,99(7). |
| APA | Z. J. Lin,M. J. Zhuo,Y. C. Zhou,M. S. Li,&J. Y. Wang.(2006).Atomic scale characterization of layered ternary Cr2AlC ceramic.Journal of Applied Physics,99(7). |
| MLA | Z. J. Lin,et al."Atomic scale characterization of layered ternary Cr2AlC ceramic".Journal of Applied Physics 99.7(2006). |
入库方式： OAI收割
来源：金属研究所
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