TEM specimen preparation for Al-based amorphous alloys
文献类型：期刊论文
| 作者 | H. W. Yang ; X. C. Chang ; W. L. Hou ; J. Q. Wang |
| 刊名 | Journal of Materials Science & Technology
 |
| 出版日期 | 2006 |
| 卷号 | 22期号:5页码:655-658 |
| 关键词 | Al-based amorphous alloy transmission electron microscopy electropolishing metallic glasses primary crystallization phase-separation nanocrystallization aluminum |
| ISSN号 | 1005-0302 |
| 中文摘要 | Transmission electron microscopy (TEM) is usually used to identify the amorphicity. However, some artifacts may be introduced due to improper TEM foil preparation. In this paper, three Al-rich metallic glasses with and without a glass transition were selected for characterizing the effect of the electropolishing condition on the as-quenched structure during TEM specimen preparation. It is shown that the occurrence of the modulated bright-dark structure under TEM observation is closely sensitive to the electropolishing condition, which suggests us being careful about the possible artifacts induced by specimen preparation when examining amorphous alloys under TEM. |
| 原文出处 | |
| 公开日期 | 2012-04-14 |
| 源URL | [http://ir.imr.ac.cn/handle/321006/34639]  |
| 专题 | 金属研究所_中国科学院金属研究所 |
| 推荐引用方式 GB/T 7714 | H. W. Yang,X. C. Chang,W. L. Hou,et al. TEM specimen preparation for Al-based amorphous alloys[J]. Journal of Materials Science & Technology,2006,22(5):655-658. |
| APA | H. W. Yang,X. C. Chang,W. L. Hou,&J. Q. Wang.(2006).TEM specimen preparation for Al-based amorphous alloys.Journal of Materials Science & Technology,22(5),655-658. |
| MLA | H. W. Yang,et al."TEM specimen preparation for Al-based amorphous alloys".Journal of Materials Science & Technology 22.5(2006):655-658. |
入库方式： OAI收割
来源：金属研究所
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