Phase transition properties of ferroelectric thin films with two surface layers
文献类型:期刊论文
作者 | X. Yang ; X. Y. Kuang ; C. Lu |
刊名 | Solid State Communications
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出版日期 | 2006 |
卷号 | 139期号:8页码:397-402 |
关键词 | ferroelectrics thin films phase transitions transverse ising-model diagrams superlattice |
ISSN号 | 0038-1098 |
中文摘要 | The phase diagrams of ferroelectric thin films with two surface layers described by the transverse Ising model have been studied under the mean-field approximation. We discuss the effects of the exchange interaction and transverse field parameters on the phase diagrams. The results indicate that the phase transition properties of the phase diagrams can be greatly modified by changing the transverse Ising model parameters. In addition, the crossover features of the parameters from the ferroelectric dominant phase diagram to the paraelectric dominant phase diagram are determined for ferroelectric thin films with two surface layers. (c) 2006 Elsevier Ltd. All rights reserved. |
原文出处 | |
公开日期 | 2012-04-14 |
源URL | [http://ir.imr.ac.cn/handle/321006/34648] ![]() |
专题 | 金属研究所_中国科学院金属研究所 |
推荐引用方式 GB/T 7714 | X. Yang,X. Y. Kuang,C. Lu. Phase transition properties of ferroelectric thin films with two surface layers[J]. Solid State Communications,2006,139(8):397-402. |
APA | X. Yang,X. Y. Kuang,&C. Lu.(2006).Phase transition properties of ferroelectric thin films with two surface layers.Solid State Communications,139(8),397-402. |
MLA | X. Yang,et al."Phase transition properties of ferroelectric thin films with two surface layers".Solid State Communications 139.8(2006):397-402. |
入库方式: OAI收割
来源:金属研究所
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