中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Dislocation evolution in twins of cyclically deformed copper

文献类型:期刊论文

作者X. L. Guo ; L. Lu ; S. X. Li
刊名Philosophical Magazine Letters
出版日期2005
卷号85期号:12页码:613-623
关键词high cycle fatigue substructure evolution polycrystalline copper low-amplitude grain-size deformation microstructures boundaries cu stresses
ISSN号0950-0839
中文摘要The evolution of dislocation structure in twins of different thicknesses has been investigated in polycrystalline copper fatigued at room temperature under constant plastic axial strain amplitude control. The dislocation structure and its evolution strongly depend on twin thickness. Three critical thicknesses must be distinguished, i.e. (i) characteristic size of fatigue dislocation structures, about 1 mm; (ii) critical height of stable dislocation wall structure, about 200 nm; (iii) critical spacing of dislocation dipole, about 20 nm. It is considered that the size effect is mainly caused by twin boundaries (TBs) which play different roles on slip behaviors in twins.
原文出处://WOS:000234228400001
公开日期2012-04-14
源URL[http://ir.imr.ac.cn/handle/321006/34858]  
专题金属研究所_中国科学院金属研究所
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GB/T 7714
X. L. Guo,L. Lu,S. X. Li. Dislocation evolution in twins of cyclically deformed copper[J]. Philosophical Magazine Letters,2005,85(12):613-623.
APA X. L. Guo,L. Lu,&S. X. Li.(2005).Dislocation evolution in twins of cyclically deformed copper.Philosophical Magazine Letters,85(12),613-623.
MLA X. L. Guo,et al."Dislocation evolution in twins of cyclically deformed copper".Philosophical Magazine Letters 85.12(2005):613-623.

入库方式: OAI收割

来源:金属研究所

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