Determination of proof stress and strain-hardening exponent for thin film with biaxial residual stresses by in-situ XRD stress analysis combined with tensile test
文献类型：期刊论文
| 作者 | M. Qin ; V. Ji ; Y. N. Wu ; C. R. Chen ; J. B. Li |
| 刊名 | Surface & Coatings Technology
 |
| 出版日期 | 2005 |
| 卷号 | 192期号:2-3页码:139-144 |
| 关键词 | proof stress strain-hardening exponent biaxial stresses Cu film TiN film tensile test in-situ X-ray diffraction alloy |
| ISSN号 | 0257-8972 |
| 中文摘要 | A new method is put forward to measure the proof stress and strain-hardening exponent of polycrystalline films (Cu, TiN) under a biaxial residual stresses state on the substrates. The Cu and TiN films were deposited on the steel substrates by ion beam-assisted magnetron sputtering and plasma-assisted chemical vapor deposition (PACVD), respectively. During the tensile test, the longitudinal stress (sigma(1)) and transverse stress (sigma(2)) of the films were determined by in-situ X-ray diffraction, and the applied strain (epsilon(a)) of the films were measured by a strain gauge. Based on the experimental results, the equivalent stresses sigma |
| 原文出处 | |
| 公开日期 | 2012-04-14 |
| 源URL | [http://ir.imr.ac.cn/handle/321006/35007]  |
| 专题 | 金属研究所_中国科学院金属研究所 |
| 推荐引用方式 GB/T 7714 | M. Qin,V. Ji,Y. N. Wu,et al. Determination of proof stress and strain-hardening exponent for thin film with biaxial residual stresses by in-situ XRD stress analysis combined with tensile test[J]. Surface & Coatings Technology,2005,192(2-3):139-144. |
| APA | M. Qin,V. Ji,Y. N. Wu,C. R. Chen,&J. B. Li.(2005).Determination of proof stress and strain-hardening exponent for thin film with biaxial residual stresses by in-situ XRD stress analysis combined with tensile test.Surface & Coatings Technology,192(2-3),139-144. |
| MLA | M. Qin,et al."Determination of proof stress and strain-hardening exponent for thin film with biaxial residual stresses by in-situ XRD stress analysis combined with tensile test".Surface & Coatings Technology 192.2-3(2005):139-144. |
入库方式： OAI收割
来源：金属研究所
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