Size effect of nano-copper films on complex optical constant and permittivity in frared region
文献类型：期刊论文
| 作者 | H. Du ; S. W. Lee ; J. Gong ; C. Sun ; L. S. Wen |
| 刊名 | Materials Letters
 |
| 出版日期 | 2004 |
| 卷号 | 58期号:6页码:1117-1120 |
| 关键词 | magnetron sputtering nano-copper film complex optical constant complex permittivity size effect thin-films reflectance thickness |
| ISSN号 | 0167-577X |
| 中文摘要 | Nano-copper films were prepared by DC magnetron sputtering. Their reflectivity and transmittivity to electromagnetic wave in infrared region were measured with Fourier Transformation Infrared Spectrometer (FTIR), by which their complex optical constant and permittivity were obtained. The results show that the complex optical constant and pen-nittivity of nano-copper films depend upon the film thickness. This dependence is correlated with microstructure transition during the film growth. (C) 2003 Elsevier B.V. All rights reserved. |
| 原文出处 | |
| 公开日期 | 2012-04-14 |
| 源URL | [http://ir.imr.ac.cn/handle/321006/35350]  |
| 专题 | 金属研究所_中国科学院金属研究所 |
| 推荐引用方式 GB/T 7714 | H. Du,S. W. Lee,J. Gong,et al. Size effect of nano-copper films on complex optical constant and permittivity in frared region[J]. Materials Letters,2004,58(6):1117-1120. |
| APA | H. Du,S. W. Lee,J. Gong,C. Sun,&L. S. Wen.(2004).Size effect of nano-copper films on complex optical constant and permittivity in frared region.Materials Letters,58(6),1117-1120. |
| MLA | H. Du,et al."Size effect of nano-copper films on complex optical constant and permittivity in frared region".Materials Letters 58.6(2004):1117-1120. |
入库方式： OAI收割
来源：金属研究所
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