中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Studies of the anion position parameter chi of the ternary semiconductor CuGaS2 by use of Ni+ ion probe

文献类型:期刊论文

作者X. X. Wu ; W. C. Zheng ; T. Sheng ; H. Zi
刊名Materials Science and Engineering B-Solid State Materials for Advanced Technology
出版日期2004
卷号107期号:2页码:186-188
关键词structural parameter electron paramagnetic resonance (EPR) optical spectrum crystal-field theory CuGaS2 Ni+ chalcopyrite semiconductors superposition model crystal
ISSN号0921-5107
中文摘要The anion position parameter chi of NiS4 cluster formed in the ternary semiconductor CuGaS2 by substitution of Ni+ for Cu+ has been determined by studying the optical spectra and EPR data for CuGaS2:Ni+. The result (chi approximate to 0.263(1)) is consistent with the mean value of the X-ray measurement results reported in two groups of references and also with the calculated value obtained from the conservation of tetrahedral bonds (CTB) plus eta = eta(tet) rule (where eta = c/2a). So, we suggest that the anion position parameter chi in pure CuGaS2 crystal is close to the above value obtained by use of Ni+ ion probe. The optical absorption bands and g factors g(parallel to), g(perpendicular to), of CuGaS2: Ni+ are therefore explained reasonably from the anion position parameter. (C) 2003 Elsevier B.V. All rights reserved.
原文出处://WOS:000220274200014
公开日期2012-04-14
源URL[http://ir.imr.ac.cn/handle/321006/35640]  
专题金属研究所_中国科学院金属研究所
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X. X. Wu,W. C. Zheng,T. Sheng,et al. Studies of the anion position parameter chi of the ternary semiconductor CuGaS2 by use of Ni+ ion probe[J]. Materials Science and Engineering B-Solid State Materials for Advanced Technology,2004,107(2):186-188.
APA X. X. Wu,W. C. Zheng,T. Sheng,&H. Zi.(2004).Studies of the anion position parameter chi of the ternary semiconductor CuGaS2 by use of Ni+ ion probe.Materials Science and Engineering B-Solid State Materials for Advanced Technology,107(2),186-188.
MLA X. X. Wu,et al."Studies of the anion position parameter chi of the ternary semiconductor CuGaS2 by use of Ni+ ion probe".Materials Science and Engineering B-Solid State Materials for Advanced Technology 107.2(2004):186-188.

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来源:金属研究所

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