中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Temperature dependent x-ray diffraction study on Gd5Sn4 compound

文献类型:期刊论文

作者H. F. Yang ; G. H. Rao ; G. Y. Liu ; Z. W. Ouyang ; W. F. Liu ; X. M. Feng ; W. G. Chu ; J. K. Liang
刊名Journal of Alloys and Compounds
出版日期2004
卷号368期号:1-2页码:248-250
关键词crystal structure rare earth compounds X-ray diffraction electrical-resistance magnetic-field transition gd-5(si2ge2)
ISSN号0925-8388
中文摘要The structure and the magnetic properties of the Gd5Sn4 compound have been investigated by means of X-ray diffraction (XRD) and magnetization measurements. Temperature dependent XRD investigation reveals that there is no structural transition around the temperature at which the first-order magnetic transition occurs in this compound, i.e. the compound retains the Sm5Ge4-type structure from 80 K(T-C), which is different from the Gd-5(Si, Ge)(4) system. Based on the Rietveld refinement of the XRD pattern of Gd5Sn4 compound, we show that the unit cell volume exhibits a dip near the Curie temperature, i.e. a negative coefficient of thermal expansion alpha approximate to -1.5 x 10(-4) K-1 from 82 to 90 K and a positive coefficient alpha approximate to 2.2 x 10(-4) K-1 from 90 to 98 K. The coefficient of thermal expansion from 98 to 298 K is only 2.5 x 10(-5) K-1. (C) 2003 Elsevier B.V. All rights reserved.
原文出处://WOS:000220633200037
公开日期2012-04-14
源URL[http://ir.imr.ac.cn/handle/321006/35664]  
专题金属研究所_中国科学院金属研究所
推荐引用方式
GB/T 7714
H. F. Yang,G. H. Rao,G. Y. Liu,et al. Temperature dependent x-ray diffraction study on Gd5Sn4 compound[J]. Journal of Alloys and Compounds,2004,368(1-2):248-250.
APA H. F. Yang.,G. H. Rao.,G. Y. Liu.,Z. W. Ouyang.,W. F. Liu.,...&J. K. Liang.(2004).Temperature dependent x-ray diffraction study on Gd5Sn4 compound.Journal of Alloys and Compounds,368(1-2),248-250.
MLA H. F. Yang,et al."Temperature dependent x-ray diffraction study on Gd5Sn4 compound".Journal of Alloys and Compounds 368.1-2(2004):248-250.

入库方式: OAI收割

来源:金属研究所

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