Temperature dependent x-ray diffraction study on Gd5Sn4 compound
文献类型:期刊论文
作者 | H. F. Yang ; G. H. Rao ; G. Y. Liu ; Z. W. Ouyang ; W. F. Liu ; X. M. Feng ; W. G. Chu ; J. K. Liang |
刊名 | Journal of Alloys and Compounds
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出版日期 | 2004 |
卷号 | 368期号:1-2页码:248-250 |
关键词 | crystal structure rare earth compounds X-ray diffraction electrical-resistance magnetic-field transition gd-5(si2ge2) |
ISSN号 | 0925-8388 |
中文摘要 | The structure and the magnetic properties of the Gd5Sn4 compound have been investigated by means of X-ray diffraction (XRD) and magnetization measurements. Temperature dependent XRD investigation reveals that there is no structural transition around the temperature at which the first-order magnetic transition occurs in this compound, i.e. the compound retains the Sm5Ge4-type structure from 80 K( |
原文出处 | |
公开日期 | 2012-04-14 |
源URL | [http://ir.imr.ac.cn/handle/321006/35664] ![]() |
专题 | 金属研究所_中国科学院金属研究所 |
推荐引用方式 GB/T 7714 | H. F. Yang,G. H. Rao,G. Y. Liu,et al. Temperature dependent x-ray diffraction study on Gd5Sn4 compound[J]. Journal of Alloys and Compounds,2004,368(1-2):248-250. |
APA | H. F. Yang.,G. H. Rao.,G. Y. Liu.,Z. W. Ouyang.,W. F. Liu.,...&J. K. Liang.(2004).Temperature dependent x-ray diffraction study on Gd5Sn4 compound.Journal of Alloys and Compounds,368(1-2),248-250. |
MLA | H. F. Yang,et al."Temperature dependent x-ray diffraction study on Gd5Sn4 compound".Journal of Alloys and Compounds 368.1-2(2004):248-250. |
入库方式: OAI收割
来源:金属研究所
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