中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Plasma load characteristics of pulsed-bias arc ion plating

文献类型:期刊论文

作者G. Q. Lin ; Z. F. Ding ; D. Qi ; Y. H. Zhao ; N. H. Wang ; C. Dong ; R. F. Huang ; L. S. Wen
刊名Journal of Vacuum Science & Technology A
出版日期2003
卷号21期号:5页码:1675-1679
关键词cathodic-arc surface modification implantation deposition voltage tin model
ISSN号0734-2101
中文摘要In a pulsed-bias arc ion plating system, the load voltage and current in the substrate circuit manifest oscillation behaviors. A simple analogous electrical circuit model is then constructed, which consists of a pair of capacitor and resistor connected in parallel. The output of the analogous circuit reproduces the oscillation profiles measured from experiments. Finally, plasma sheath theory is used to explain the capacitance characteristic of the plasma load. (C) 2003 American Vacuum Society.
原文出处://WOS:000185608100021
公开日期2012-04-14
源URL[http://ir.imr.ac.cn/handle/321006/35912]  
专题金属研究所_中国科学院金属研究所
推荐引用方式
GB/T 7714
G. Q. Lin,Z. F. Ding,D. Qi,et al. Plasma load characteristics of pulsed-bias arc ion plating[J]. Journal of Vacuum Science & Technology A,2003,21(5):1675-1679.
APA G. Q. Lin.,Z. F. Ding.,D. Qi.,Y. H. Zhao.,N. H. Wang.,...&L. S. Wen.(2003).Plasma load characteristics of pulsed-bias arc ion plating.Journal of Vacuum Science & Technology A,21(5),1675-1679.
MLA G. Q. Lin,et al."Plasma load characteristics of pulsed-bias arc ion plating".Journal of Vacuum Science & Technology A 21.5(2003):1675-1679.

入库方式: OAI收割

来源:金属研究所

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