Characterization of the microstructure in CMR materials by HREM
文献类型：期刊论文
| 作者 | D. X. Li ; M. G. Wang ; H. Q. Ye |
| 刊名 | Journal of Electron Microscopy
 |
| 出版日期 | 2002 |
| 卷号 | 51页码:S271-S278 |
| 关键词 | HREM CMR materials defect microdomain strain interface pulsed-laser deposition thin-films giant magnetoresistance superlattices multilayers resistivity oxide |
| ISSN号 | 0022-0744 |
| 中文摘要 | The microstructures of La0.7Ca0.3MnO3 (LCMO) and La1.0Nd0.2Sr1.8Mn2O7 (LNSMO) bulk materials, LCMO thin films prepared by different methods, and LCMO/Gd0.7Ca0.3MnO3 (GCMO) multilayers have been studied by high-resolution electron microscopy. Twins and microdomains in the LCMO bulk materials as well as the intergrowth structure, ( 10 1) crystal shear Structure, and a complex defect structure in LNSMO bulk materials were observed. The displacement of oxygen ion in LCMO films grown on LaAlO3 (LAO) by pulsed laser deposition (PLD) method induces the structure transformation from orthorhombic to monoclinic. The evolution of strain in LCMO films prepared by reactive sputtering (RS) method on both LAO and SrTiO3 substrates was studied as a function of film thickness. The distribution and size of oriented domains observed in LCMO films prepared by RS were different from those prepared by PLD. The inner strains exist in LCMO and GCMO layers, which might result in lower T, and larger resistivity maximum in LCMO/GCMO multilayers. |
| 原文出处 | |
| 公开日期 | 2012-04-14 |
| 源URL | [http://ir.imr.ac.cn/handle/321006/36310]  |
| 专题 | 金属研究所_中国科学院金属研究所 |
| 推荐引用方式 GB/T 7714 | D. X. Li,M. G. Wang,H. Q. Ye. Characterization of the microstructure in CMR materials by HREM[J]. Journal of Electron Microscopy,2002,51:S271-S278. |
| APA | D. X. Li,M. G. Wang,&H. Q. Ye.(2002).Characterization of the microstructure in CMR materials by HREM.Journal of Electron Microscopy,51,S271-S278. |
| MLA | D. X. Li,et al."Characterization of the microstructure in CMR materials by HREM".Journal of Electron Microscopy 51(2002):S271-S278. |
入库方式： OAI收割
来源：金属研究所
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