中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
TEM observation of the phase transition in indented GaAs

文献类型:期刊论文

作者Z. C. Li ; L. Liu ; X. Wu ; L. L. He ; Y. B. Xu
刊名Materials Letters
出版日期2002
卷号55期号:3页码:200-204
关键词GaAs single crystal Vickers indentation phase transition high-pressure silicon indentation hardness microindentation crystals
ISSN号0167-577X
中文摘要Indentations carried out with the loads of 0.0049, 0.049 and 0.098 N, respectively, on the surface of GaAs single crystal have been observed using transmission electron microscopy (TEM). The results show that plastic deformation took place in all the samples and phase transformation was induced by indentation. The microcrystal occurred beneath the 0.0049-N load indentation and the amorphous structure was formed under the 0.049-N load indentation. No obvious phase transformation was found beneath the 0.098-N load indentation. The possible mechanisms for the transformation from crystalline to the amorphous and microcrystalline structure were discussed. (C) 2002 Published by Elsevier Science B.V.
原文出处://WOS:000176852000012
公开日期2012-04-14
源URL[http://ir.imr.ac.cn/handle/321006/36327]  
专题金属研究所_中国科学院金属研究所
推荐引用方式
GB/T 7714
Z. C. Li,L. Liu,X. Wu,et al. TEM observation of the phase transition in indented GaAs[J]. Materials Letters,2002,55(3):200-204.
APA Z. C. Li,L. Liu,X. Wu,L. L. He,&Y. B. Xu.(2002).TEM observation of the phase transition in indented GaAs.Materials Letters,55(3),200-204.
MLA Z. C. Li,et al."TEM observation of the phase transition in indented GaAs".Materials Letters 55.3(2002):200-204.

入库方式: OAI收割

来源:金属研究所

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